Quantitative scanning transmission electron microscopy for materials science: Imaging, diffraction, spectroscopy, and tomography

C Ophus - Annual Review of Materials Research, 2023 - annualreviews.org
Scanning transmission electron microscopy (STEM) is one of the most powerful
characterization tools in materials science research. Due to instrumentation developments …

The role of high-resolution transmission electron microscopy and aberration corrected scanning transmission electron microscopy in unraveling the structure-property …

L Bijelić, F Ruiz-Zepeda, N Hodnik - Inorganic chemistry frontiers, 2024 - pubs.rsc.org
Platinum-based fuel cell electrocatalysts are structured on a nano level in order to extend
their active surface area and maximize the utilization of precious and scarce platinum. Their …

Disentangling multiple scattering with deep learning: application to strain mapping from electron diffraction patterns

J Munshi, A Rakowski, BH Savitzky… - npj Computational …, 2022 - nature.com
A fast, robust pipeline for strain mapping of crystalline materials is important for many
technological applications. Scanning electron nanodiffraction allows us to calculate strain …

From STEM to 4D STEM: Ultrafast diffraction mapping with a hybrid-pixel detector

DG Stroppa, M Meffert, C Hoermann… - Microscopy …, 2023 - academic.oup.com
Abstract 4D scanning transmission electron microscope (STEM) techniques have been
increasingly featured among the electron microscopy characterization approaches, as they …

Cryogenic 4D-STEM analysis of an amorphous-crystalline polymer blend: Combined nanocrystalline and amorphous phase mapping

J Donohue, SE Zeltmann, KC Bustillo, B Savitzky… - Iscience, 2022 - cell.com
Understanding and visualizing the heterogeneous structure of immiscible semicrystalline
polymer systems is critical for optimizing their morphology and microstructure. We …

Multimodal characterization of crystal structure and formation in rubrene thin films reveals erasure of orientational discontinuities

JA Tan, JT Dull, SE Zeltmann… - Advanced Functional …, 2023 - Wiley Online Library
Multimodal multiscale characterization provide opportunities to study organic
semiconducting thin films with multiple length scales, across multiple platforms, to elucidate …

Diameter-dependent phase selectivity in 1D-confined tungsten phosphides

G Jin, CD Multunas, JL Hart, MT Kiani… - Nature …, 2024 - nature.com
Topological materials confined in 1D can transform computing technologies, such as 1D
topological semimetals for nanoscale interconnects and 1D topological superconductors for …

Visualizing Grain Statistics in MOCVD WSe2 through Four-Dimensional Scanning Transmission Electron Microscopy

A Londoño-Calderon, R Dhall, C Ophus… - Nano Letters, 2022 - ACS Publications
Using four-dimensional scanning transmission electron microscopy, we demonstrate a
method to visualize grains and grain boundaries in WSe2 grown by metal organic chemical …

Clustering Characteristic Diffraction Vectors in 4-D STEM Data Sets from Overlapping Structures in Nanocrystalline and Amorphous Materials

C Francis, PM Voyles - Ultramicroscopy, 2024 - Elsevier
We describe a method for identifying and clustering diffraction vectors in four-dimensional (4-
D) scanning transmission electron microscopy data to determine characteristic diffraction …

Improved ACOM pattern matching in 4D-STEM through adaptive sub-pixel peak detection and image reconstruction

N Folastre, J Cao, G Oney, S Park, A Jamali… - Scientific Reports, 2024 - nature.com
The technique known as 4D-STEM has recently emerged as a powerful tool for the local
characterization of crystalline structures in materials, such as cathode materials for Li-ion …