BEEM imaging and spectroscopy of buried structures in semiconductors

V Narayanamurti, M Kozhevnikov - Physics Reports, 2001 - Elsevier
Ballistic Electron Emission Microscopy (BEEM) has been shown to be a powerful tool for
nanometer-scale characterization of the spatial and electronic properties of semiconductor …

Hot electron spectroscopy and microscopy

J Smoliner, D Rakoczy, M Kast - Reports on Progress in Physics, 2004 - iopscience.iop.org
Semiconductor heterostructures, such as double-barrier resonant tunnelling diodes and
superlattices, are nowadays used for many applications. One very versatile and powerful …

Heterostructure at CMOS source/drain: Contributor or alleviator to the high access resistance problem?

H Yu, M Schaekers, E Rosseel… - 2016 IEEE …, 2016 - ieeexplore.ieee.org
This work investigates the interface resistivity of several heterostructures. Theoretical
simulations suggest that, apart from the doping impact, the band offset and the difference in …

Ballistic electron emission microscopy on biased GaAs–AlGaAs superlattices

R Heer, J Smoliner, G Strasser, E Gornik - Applied physics letters, 1998 - pubs.aip.org
In this work, ballistic electron transport through the lowest miniband of a biased GaAs–
AlGaAs superlattice is investigated by ballistic electron emission microscopy (BEEM). In the …

Ballistic hot-electron transport in nanoscale semiconductor heterostructures: Exact self-energy of a three-dimensional periodic tight-binding Hamiltonian

I Appelbaum, T Wang, JD Joannopoulos… - Physical Review B, 2004 - APS
As the length scale for semiconductor heterostructures approaches the regime of the lattice
constant, our current theory for calculating ballistic hot-electron transport becomes …

filtering in resonant-tunneling processes between materials of different effective electron mass

J Smoliner, R Heer, G Strasser - Physical Review B, 1999 - APS
If electrons are transferred across an interface between an area of high and low effective
mass, parallel momentum conservation leads to electron refraction effects, which are evident …

L-valley electron transport in GaAs-AlAs double-barrier resonant tunneling structures studied by ballistic electron emission microscopy

D Rakoczy, G Strasser, C Strahberger, J Smoliner - Physical Review B, 2002 - APS
Ballistic electron emission microscopy (BEEM) is capable of injecting electrons into the L
valley of a GaAs-AlAs double-barrier resonant tunneling diode (DBRTD) coherently …

Narrow electron injector for ballistic electron spectroscopy

M Kast, C Pacher, G Strasser, E Gornik - Applied Physics Letters, 2001 - pubs.aip.org
A three-terminal hot electron transistor is used to measure the normal energy distribution of
ballistic electrons generated by an electron injector utilizing an improved injector design. A …

Refraction of thermalized electrons emitted ballistically into vacuum from p +-GaAs-(Cs,O)

VV Bakin, AA Pakhnevich, SN Kosolobov… - Journal of Experimental …, 2003 - Springer
The refraction of thermalized photoelectrons emitted into vacuum from p+-GaAs-(Cs, O) with
a negative electron affinity was observed. The refraction is caused by a jump in electron …

Metal–insulator–metal injector for ballistic electron emission spectroscopy

R Heer, D Rakoczy, G Ploner, G Strasser… - Applied Physics …, 1999 - pubs.aip.org
We introduce a solid-state version of ballistic electron emission microscopy/spectroscopy
(BEEM/BEES) on GaAs–AlGaAs heterostructures using a metal–insulator–metal (MIM) …