Recent development of vertical GaN power devices

T Oka - Japanese Journal of Applied Physics, 2019 - iopscience.iop.org
Gallium nitride (GaN) is an attractive material for high-frequency and high-power devices.
Due to the availability of relatively high-quality free-standing bulk GaN substrates, the …

Power electronics revolutionized: A comprehensive analysis of emerging wide and ultrawide bandgap devices

SMSH Rafin, R Ahmed, MA Haque, MK Hossain… - Micromachines, 2023 - mdpi.com
This article provides a comprehensive review of wide and ultrawide bandgap power
electronic semiconductor devices, comparing silicon (Si), silicon carbide (SiC), gallium …

A survey of wide bandgap power semiconductor devices

J Millan, P Godignon, X Perpiñà… - IEEE transactions on …, 2013 - ieeexplore.ieee.org
Wide bandgap semiconductors show superior material properties enabling potential power
device operation at higher temperatures, voltages, and switching speeds than current Si …

Reliability and performance limitations in SiC power devices

R Singh - Microelectronics reliability, 2006 - Elsevier
Despite silicon carbide's (SiC's) high breakdown electric field, high thermal conductivity and
wide bandgap, it faces certain reliability challenges when used to make conventional power …

[图书][B] Gallium nitride and silicon carbide power devices

BJ Baliga - 2016 - books.google.com
During the last 30 years, significant progress has been made to improve our understanding
of gallium nitride and silicon carbide device structures, resulting in experimental …

A review of WBG power semiconductor devices

J Millan - CAS 2012 (International Semiconductor Conference), 2012 - ieeexplore.ieee.org
It is worldwide accepted that a real breakthrough in the Power Electronics field mainly
comes from the development and use of Wide Band Gap (WBG) semiconductor devices …

Materials and processes for Schottky contacts on silicon carbide

M Vivona, F Giannazzo, F Roccaforte - Materials, 2021 - mdpi.com
Silicon carbide (4H-SiC) Schottky diodes have reached a mature level of technology and are
today essential elements in many applications of power electronics. In this context, the study …

Protection of selectively implanted and patterned silicon carbide surfaces with graphite capping layer during post-implantation annealing

KV Vassilevski, NG Wright, IP Nikitina… - Semiconductor …, 2005 - iopscience.iop.org
A graphite capping layer has been evaluated to protect the surface of patterned and
selectively implanted 4H–SiC epitaxial wafers during post-implantation annealing. AZ …

1.2-kV 4H-SiC merged PiN Schottky diode with improved surge current capability

J Wu, N Ren, H Wang, K Sheng - IEEE Journal of Emerging and …, 2019 - ieeexplore.ieee.org
This paper presents the design and experimental analysis of 1200-V 4H-silicon carbide
(SiC) merged PiN Schottky (MPS) diodes. Design considerations and device performances …

Wide band-gap power semiconductor devices

J Millán - IET Circuits, Devices & Systems, 2007 - search.proquest.com
The recent progress in the development of high-voltage SiC, GaN and diamond power
devices is reviewed. Topics covered include the performance of various rectifiers and …