This article provides a comprehensive review of wide and ultrawide bandgap power electronic semiconductor devices, comparing silicon (Si), silicon carbide (SiC), gallium …
J Millan, P Godignon, X Perpiñà… - IEEE transactions on …, 2013 - ieeexplore.ieee.org
Wide bandgap semiconductors show superior material properties enabling potential power device operation at higher temperatures, voltages, and switching speeds than current Si …
R Singh - Microelectronics reliability, 2006 - Elsevier
Despite silicon carbide's (SiC's) high breakdown electric field, high thermal conductivity and wide bandgap, it faces certain reliability challenges when used to make conventional power …
During the last 30 years, significant progress has been made to improve our understanding of gallium nitride and silicon carbide device structures, resulting in experimental …
J Millan - CAS 2012 (International Semiconductor Conference), 2012 - ieeexplore.ieee.org
It is worldwide accepted that a real breakthrough in the Power Electronics field mainly comes from the development and use of Wide Band Gap (WBG) semiconductor devices …
Silicon carbide (4H-SiC) Schottky diodes have reached a mature level of technology and are today essential elements in many applications of power electronics. In this context, the study …
A graphite capping layer has been evaluated to protect the surface of patterned and selectively implanted 4H–SiC epitaxial wafers during post-implantation annealing. AZ …
J Wu, N Ren, H Wang, K Sheng - IEEE Journal of Emerging and …, 2019 - ieeexplore.ieee.org
This paper presents the design and experimental analysis of 1200-V 4H-silicon carbide (SiC) merged PiN Schottky (MPS) diodes. Design considerations and device performances …
The recent progress in the development of high-voltage SiC, GaN and diamond power devices is reviewed. Topics covered include the performance of various rectifiers and …