[HTML][HTML] Overview of atomic layer etching in the semiconductor industry

KJ Kanarik, T Lill, EA Hudson, S Sriraman… - Journal of Vacuum …, 2015 - pubs.aip.org
Atomic layer etching (ALE) is a technique for removing thin layers of material using
sequential reaction steps that are self-limiting. ALE has been studied in the laboratory for …

Plasma nanoscience: from nano-solids in plasmas to nano-plasmas in solids

K Ostrikov, EC Neyts, M Meyyappan - Advances in Physics, 2013 - Taylor & Francis
The unique plasma-specific features and physical phenomena in the organization of
nanoscale soild-state systems in a broad range of elemental composition, structure, and …

Plasma processing of low-k dielectrics

MR Baklanov, JF de Marneffe, D Shamiryan… - Journal of Applied …, 2013 - pubs.aip.org
This paper presents an in-depth overview of the present status and novel developments in
the field of plasma processing of low dielectric constant (low-k) materials developed for …

Pulsed plasma etching for semiconductor manufacturing

DJ Economou - Journal of Physics D: Applied Physics, 2014 - iopscience.iop.org
Power-modulated (pulsed) plasmas have demonstrated several advantages compared to
continuous wave (CW) plasmas. Specifically, pulsed plasmas can result in a higher etching …

Plasma nanoscience: setting directions, tackling grand challenges

KK Ostrikov, U Cvelbar, AB Murphy - Journal of Physics D …, 2011 - iopscience.iop.org
This review paper presents historical perspectives, recent advances and future directions in
the multidisciplinary research field of plasma nanoscience. The current status and future …

Pulsed high-density plasmas for advanced dry etching processes

S Banna, A Agarwal, G Cunge, M Darnon… - Journal of Vacuum …, 2012 - pubs.aip.org
Plasma etching processes at the 22 nm technology node and below will have to satisfy
multiple stringent scaling requirements of microelectronics fabrication. To satisfy these …

Impact of VUV photons on SiO2 and organosilicate low-k dielectrics: General behavior, practical applications, and atomic models

MR Baklanov, V Jousseaume, TV Rakhimova… - Applied Physics …, 2019 - pubs.aip.org
This paper presents an in-depth overview of the application and impact of UV/VUV light in
advanced interconnect technology. UV light application in BEOL historically was mainly …

Alternative process for thin layer etching: Application to nitride spacer etching stopping on silicon germanium

N Posseme, O Pollet, S Barnola - Applied Physics Letters, 2014 - pubs.aip.org
Silicon nitride spacer etching realization is considered today as one of the most challenging
of the etch process for the new devices realization. For this step, the atomic etch precision to …

Effect of different pulse modes during Cl2/Ar inductively coupled plasma etching on the characteristics of nanoscale silicon trench formation

HJ Kim, L Wen, D San Kim, KH Kim, JW Hong… - Applied Surface …, 2022 - Elsevier
The etch characteristics of silicon trenches masked with various SiO 2/Si 3 N 4 pattern
distances were investigated using synchronously and asynchronously pulse modes in …

Increase in the efficiency of III-nitride micro-LEDs: atomic-layer deposition and etching

AC Liu, KJ Singh, YM Huang, T Ahmed… - IEEE …, 2021 - ieeexplore.ieee.org
MICRO-LEDs (n-LEDs) HAVE been engaged in the next-generation display technology and
evolved for various applications from several electronics manufacturers and institutions. The …