Phase change thin films for non-volatile memory applications

A Lotnyk, M Behrens, B Rauschenbach - Nanoscale Advances, 2019 - pubs.rsc.org
The rapid development of Internet of Things devices requires real time processing of a huge
amount of digital data, creating a new demand for computing technology. Phase change …

Phase-change memory from molecular tellurides

FM Schenk, T Zellweger, D Kumaar, D Bošković… - ACS …, 2023 - ACS Publications
Phase-change memory (PCM) is an emerging memory technology based on the resistance
contrast between the crystalline and amorphous states of a material. Further development …

In situ atomic-scale observation of transformation from disordered to ordered layered structures in Ge-Sb-Te phase change memory thin films

A Lotnyk, T Dankwort, M Behrens, L Voß, S Cremer… - Acta Materialia, 2024 - Elsevier
Abstract Ge-Sb-Te (GST) thin films are emerging materials for various non-volatile memory
applications. The compounds contain a huge number of vacancies that play important roles …

Chemical phase segregation during the crystallization of Ge-rich GeSbTe alloys

M Agati, M Vallet, S Joulié, D Benoit… - Journal of Materials …, 2019 - pubs.rsc.org
Ge-rich Ge–Sb–Te alloys are materials with potential for new non-volatile memories named
Phase Change Memories offering an extended range of possible applications. However, the …

In situ observations of the reversible vacancy ordering process in van der Waals-bonded Ge–Sb–Te thin films and GeTe–Sb 2 Te 3 superlattices

A Lotnyk, T Dankwort, I Hilmi, L Kienle… - Nanoscale, 2019 - pubs.rsc.org
Chalcogenide-based thin films are employed in data storage and memory technology
whereas van der Waals-bonded layered chalcogenide heterostructures are considered to …

[HTML][HTML] Effect of nitrogen vacancies on the growth, dislocation structure, and decomposition of single crystal epitaxial (Ti1-xAlx) Ny thin films

KM Calamba, J Salamania, MPJ Jõesaar, LJS Johnson… - Acta Materialia, 2021 - Elsevier
The effect of varying nitrogen vacancies on the growth, microstructure, spinodal
decomposition and hardness values of predominantly single crystal cubic phase c-(Ti 1-x Al …

[HTML][HTML] The origin of hexagonal phase and its evolution process in Ge2Sb2Te5 alloy

C Liu, Q Tang, Y Zheng, B Zhang, J Zhao, W Song… - APL Materials, 2022 - pubs.aip.org
Ge 2 Sb 2 Te 5 (GST) is the most important material for phase change random access
memory (PCRAM) applications, while the formation of hexagonal (h-) phase results in low …

Microscopic mechanism of carbon-dopant manipulating device performance in CGeSbTe-based phase change random access memory

Y Cheng, D Cai, Y Zheng, S Yan, L Wu… - … applied materials & …, 2020 - ACS Publications
Carbon (C)-doped Ge2Sb2Te5 material is a potential candidate in phase change random
access memory (PCRAM) because of its superb thermal stability and ultrahigh cycle …

In situ study of vacancy disordering in crystalline phase-change materials under electron beam irradiation

TT Jiang, XD Wang, JJ Wang, YX Zhou, DL Zhang… - Acta materialia, 2020 - Elsevier
Unconventionally high amount of atomic vacancies up to more than 10% are known to form
in Ge-Sb-Te crystals upon rapid crystallization from the amorphous phase. Upon thermal …

In-situ transmission electron microscopy studies of the crystallization of N-doped Ge-rich GeSbTe materials

M Agati, F Renaud, D Benoit, A Claverie - MRS Communications, 2018 - Springer
We have studied by electron microscopy and x-ray diffraction techniques the amorphous-to-
crystalline phase transition which occurs during annealing of a highly Ge-rich and N-doped …