Photoresists in extreme ultraviolet lithography (EUVL)

D De Simone, Y Vesters… - Advanced Optical …, 2017 - degruyter.com
The evolutionary advances in photosensitive material technology, together with the
shortening of the exposure wavelength in the photolithography process, have enabled and …

Machine-learning based characteristic estimation method in printed circuit board production lines

ML Tsai, RQ Qiu, KY Wu, TH Hsu… - Flexible and Printed …, 2023 - iopscience.iop.org
In this study, software and hardware that supported automatic optical inspection (AOI) for
printed circuit board production line was proposed and demonstrated. The proposed method …

Meso scale component manufacturing: a comparative analysis of non-lithography and lithography-based processes

A Khalid, Y Wei, MR Saleem… - … of Micromechanics and …, 2022 - iopscience.iop.org
The paper identifies the meso scale (10 µm to few millimeters) component size that can be
manufactured by using both lithography and non-lithography based approaches. Non …

[HTML][HTML] Rapid, brushless self-assembly of a PS-b-PDMS block copolymer for nanolithography

S Rasappa, L Schulte, D Borah, MA Morris… - Colloids and Interface …, 2014 - Elsevier
Block copolymers (BCP) are highly promising self-assembling precursors for scalable
nanolithography. Very regular BCP nanopatterns can be used as on-chip etch masks. The …

Electromagnetic characteristic estimation on spiral antennas through AOI, ML, and AI

MJ Wu, MC Chang, CC Chung… - Flexible and Printed …, 2022 - iopscience.iop.org
In this study, a method that is able to estimate the electromagnetic characteristic of spiral
antennas was proposed and realized through consecutive procedures of automatic optical …

Terpolymerization of styrenic photoresist polymers: effect of RAFT polymerization on the compositional heterogeneity

Y Guo, DJT Hill, AK Whittaker, KS Jack, H Peng - Macromolecules, 2015 - ACS Publications
The heterogeneity of the chemical structure of photoresist polymers, both within and
between the polymer chains, is believed to contribute to the phenomenon of line edge …

Sub‐15 nm Silicon Lines Fabrication via PS‐b‐PDMS Block Copolymer Lithography

S Rasappa, L Schulte, D Borah… - Journal of …, 2013 - Wiley Online Library
This paper describes the fabrication of nanodimensioned silicon structures on silicon wafers
from thin films of a poly (styrene)‐block‐poly (dimethylsiloxane)(PS‐b‐PDMS) block …

Approach of pullulan derivatives to resist polymers for green lithography in eco-friendly optical NEMS and MEMS

S Takei, A Oshima, K Ito, K Sugahara… - Micro-Optics …, 2014 - spiedigitallibrary.org
This presentation reported an approach of glucose derivatives to resist polymers for eco-
friendly optical NEMS and MEMS. The material design concept to use the water-soluble …

High-sensitivity green resist material with organic solvent-free spin-coating and tetramethylammonium hydroxide-free water-developable processes for EB and EUV …

S Takei, M Hanabata, A Oshima… - Advances in …, 2015 - spiedigitallibrary.org
We investigated the eco-friendly electron beam (EB) and extreme-ultraviolet (EUV)
lithography using a high-sensitive negative type of green resist material derived from …

DNA‐Based Construction of Molecular Photonic Devices

GA Burley - DNA in Supramolecular Chemistry and …, 2014 - Wiley Online Library
This chapter highlights the recent developments in the use of DNA‐programmed self‐
assembly to guide the construction of discrete photonic nanostructures. It discusses the …