Building a better Li‐garnet solid electrolyte/metallic Li interface with antimony
The deployment of Li‐garnet Li7La3Zr2O12 (LLZO) solid‐state electrolytes in solid‐state
batteries is severely hampered by their poor wettability with metallic Li. In this work, Sb is …
batteries is severely hampered by their poor wettability with metallic Li. In this work, Sb is …
Roadmap for focused ion beam technologies
The focused ion beam (FIB) is a powerful tool for fabrication, modification, and
characterization of materials down to the nanoscale. Starting with the gallium FIB, which was …
characterization of materials down to the nanoscale. Starting with the gallium FIB, which was …
Review of recent advances in gas-assisted focused ion beam time-of-flight secondary ion mass spectrometry (FIB-TOF-SIMS)
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a powerful chemical
characterization technique allowing for the distribution of all material components (including …
characterization technique allowing for the distribution of all material components (including …
Top‐Down Fabrication of Ordered Nanophotonic Structures for Biomedical Applications
B Wen, J Yang, C Hu, J Cai… - Advanced Materials …, 2024 - Wiley Online Library
The size, distribution, and specific shape of ordered nanophotonic structures are crucial for
their biomedical applications. Bottom‐up approaches such as self‐assembly, emulsification …
their biomedical applications. Bottom‐up approaches such as self‐assembly, emulsification …
3D High-Resolution Chemical Characterization of Sputtered Li-Rich NMC811 Thin Films Using TOF-SIMS
Massive demand for Li-ion batteries stimulates the research of new materials such as high-
capacity cathodes, metal anodes, and solid electrolytes, which should ultimately lead to new …
capacity cathodes, metal anodes, and solid electrolytes, which should ultimately lead to new …
Mechanisms of fluorine-induced separation of mass interference during TOF-SIMS analysis
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is one of very few analytical
techniques allowing sample chemical structure to be characterized in three-dimensional …
techniques allowing sample chemical structure to be characterized in three-dimensional …
In Situ Time-of-Flight Mass Spectrometry of Ionic Fragments Induced by Focused Electron Beam Irradiation: Investigation of Electron Driven Surface Chemistry inside …
J Jurczyk, L Pillatsch, L Berger, A Priebe, K Madajska… - Nanomaterials, 2022 - mdpi.com
Recent developments in nanoprinting using focused electron beams have created a need to
develop analysis methods for the products of electron-induced fragmentation of different …
develop analysis methods for the products of electron-induced fragmentation of different …
Large volume tomography using plasma FIB-SEM: A comprehensive case study on black silicon
The xenon plasma focused ion beam and scanning electron microscopy (PFIB-SEM) system
is a promising tool for 3D tomography of nano-scale materials, including nanotextured black …
is a promising tool for 3D tomography of nano-scale materials, including nanotextured black …
Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of …
Due to excellent electric conductivity and chemical inertness, Au can be used in new
microdevices for energy applications, microelectronics, and biomedical solutions. However …
microdevices for energy applications, microelectronics, and biomedical solutions. However …
Advances in Structural and Morphological Characterization of Thin Magnetic Films: A Review
The present review places emphasis on a comprehensive survey of experimental
techniques to probe the structural and morphological features at the nanoscale range in thin …
techniques to probe the structural and morphological features at the nanoscale range in thin …