Plastic relaxation and relaxed buffer layers for semiconductor epitaxy

R Beanland, DJ Dunstan, PJ Goodhew - Advances in Physics, 1996 - Taylor & Francis
We present a critical review of the strategies used in the fabrication of mismatched
semiconductor heterostructures. By using simple concepts derived from the Matthews model …

The metal-organic chemical vapor deposition and properties of III–V antimony-based semiconductor materials

RM Biefeld - Materials Science and Engineering: R: Reports, 2002 - Elsevier
This article comprehensively reviews the growth of III–V antimony-based semiconductor
materials using metal-organic chemical vapor deposition (MOCVD). It does this by first …

Fundamental issues in heteroepitaxy—A department of energy, council on materials science panel report

EG Bauer, BW Dodson, DJ Ehrlich… - Journal of Materials …, 1990 - cambridge.org
accepted 11 January 1990) During the past decade, nonequilibrium techniques have been
developed for the growth of epitaxial semiconductors, insulators, and metals which have led …

InAs1− xSbx infrared detectors

A Rogalski - Progress in Quantum Electronics, 1989 - Elsevier
The emergence of the Hg~ _xCdxTe as the most important intrinsic semiconductor alloy
system for infrared detection is well established. However, in spite of the achievements in …

InAsSb‐based mid‐infrared lasers (3.8–3.9 μm) and light‐emitting diodes with AlAsSb claddings and semimetal electron injection, grown by metalorganic chemical …

AA Allerman, RM Biefeld, SR Kurtz - Applied physics letters, 1996 - pubs.aip.org
Gain-guided, injection lasers using AlAsSb for optical confinement and a strained
InAsSb/InAs multiquantum well active region were grown by metalorganic chemical vapor …

Role of dislocation blocking in limiting strain relaxation in heteroepitaxial films

VT Gillard, WD Nix, LB Freund - Journal of applied physics, 1994 - pubs.aip.org
The residual strain following relaxation in a variety of Si1− x Ge x heteroepitaxial films grown
on (001) Si wafers has been compared with the values of residual strain predicted by the …

Misfit dislocation density and strain relaxation in graded semiconductor heterostructures with arbitrary composition profiles

B Bertoli, EN Suarez, JE Ayers, FC Jain - Journal of Applied Physics, 2009 - pubs.aip.org
We present a computational approach for the determination of the equilibrium misfit
dislocation density and strain in a semiconductor heterostructure with an arbitrary …

The growth of antimonides by MOVPE

A Aardvark, NJ Mason, PJ Walker - … in crystal growth and characterization of …, 1997 - Elsevier
There are three main reasons for the study of antimonides, they are the optical [mainly
infrared], electrical [mainly Insb; the Gasb/Inas heterojunction] and structural [mainly …

High-detectivity (> 1* 10/sup 10/cm square root Hz/W), InAsSb strained-layer superlattice, photovoltaic infrared detector

SR Kurtz, LR Dawson, TE Zipperian… - IEEE electron device …, 1990 - ieeexplore.ieee.org
A high-detectivity infrared photodiode grown using molecular beam epitaxy (MBE) is
discussed. It consisted of a p-'i'-n device embedded in an InAs/sub 0.15/Sb/sub 0.85//InSb …

The growth of InP1-xSbx by metalorganic chemical vapor deposition

RM Biefeld, KC Baucom, SR Kurtz… - Journal of crystal growth, 1993 - Elsevier
InP 1-x Sb x was grown by metalorganic chemical vapor deposition under a variety of
conditions. The V/III vapor phase ratio was varied from 327 to 12 over a temperature range …