Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT) is a robust
alternative to classical structural ATPG. Due to the powerful reasoning engines of modern …

It is well-known that in principle automatic test pattern generation (ATPG) can be solved by
transforming the circuit and the fault considered into a Boolean satisfiability (SAT) instance …

Approximate computing has gained growing attention as it provides trade-off between output
quality and computation effort for inherent error tolerant applications such as recognition …

The need for reducing manufacturing defect escape in today's safety-critical applications
requires increased fault coverage. However, generating a test set using commercial …

Test compaction is an important aspect in the postproduction test since it is able to reduce
the test data and the test costs, respectively. Current ATPG methods treat all faults …

We describe NCSTRL+, a unified, canonical digital library for scientific and technical
information (STI). NCSTRL+ is based on the Networked Computer Science Technical Report …

Comprehensive coverage of small-delay faults under massive process variations is
achieved when multiple paths through the fault locations are sensitized by the test pair set …

VLSI design flows improve design parameters (performance, power, area, and testability)
iteratively. Whereas the “shift left” trend implies that changes at the RTL are preferred for …

Test set compaction is one of the key steps of the postproduction test known to bring down
test pattern counts. This, in turn, allows one to reduce the corresponding test data volume …

Aliasing in test response compaction is an important source of fault coverage loss. Methods
to avoid the aliasing mostly require modification of the compactor to some extent. This can …