A 1200-V-class ultra-low specific on-resistance SiC lateral MOSFET with double trench gate and VLD technique

M Kong, Z Hu, J Gao, Z Chen… - IEEE Journal of the …, 2021 - ieeexplore.ieee.org
An ultra-low specific on-resistance 4H-SiC power laterally diffused metal oxide
semiconductor (LDMOS) device is proposed for 1200V-class applications. In the proposed …

A novel optimum variation lateral doping SiC lateral double-diffused metal oxide semiconductor with improved performance

M Kong, Y Duan, J Gao, R Yan… - Semiconductor …, 2022 - iopscience.iop.org
In thsi paper a novel optimum variation lateral doping 4H-SiC lateral double-diffused metal
oxide semiconductor (LDMOS) field-effect transistor with improved performance is proposed …

Measurements and Review of Failure Mechanisms and Reliability Constraints of 4H-SiC Power MOSFETs Under Short Circuit Events

R Yu, S Jahdi, O Alatise… - … on Device and …, 2023 - ieeexplore.ieee.org
The reliability of the SiC MOSFET has always been a factor hindering the device application,
especially under high voltage and high current conditions, such as in the short circuit events …

[HTML][HTML] SiC-on-insulator based lateral power device and it's analytical models

J Yao, A Li, Y Liu, Z Hu, M Li, K Yang, J Zhang, J Chen… - Results in Physics, 2024 - Elsevier
This paper proposes the concept of SiC-on-insulator (SiCOI) lateral power device and its
analytical models. The SiCOI technology provides dielectric isolation and improves the …

A new SiC quasi MOSFET for ultra-low specific on-resistance and improved reliability

M Kong, Z Cheng, Z Hu, N Yu, B Yi… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
In this paper, a new ultra-low specific on-resistance quasi SiC MOSFET is proposed.
Compared with the conventional SiC MOSFET, the proposed quasi SiC MOSFET has no …

A novel LDMOS with circular drift region for uniform electric field distribution

C Zhang, Z Yao, H Guo, S Gao, W Yue, Y Li… - Micro and …, 2023 - Elsevier
In this paper, a lateral double diffused MOS which features a circular drift region (Cir-
LDMOS) is proposed and investigated by numerical simulation. The circular drift region in …

[HTML][HTML] A Novel 4H-SiC SGT MOSFET with Improved P+ Shielding Region and Integrated Schottky Barrier Diode

X Cao, J Liu, Y An, X Ren, Z Yin - Micromachines, 2024 - mdpi.com
A silicon carbide (SiC) SGT MOSFET featuring a “一”-shaped P+ shielding region (PSR),
named SPDT-MOS, is proposed in this article. The improved PSR is introduced as a …

4H-SiC trench gate lateral MOSFET with dual source trenches for improved performance and reliability

H Wang, B Wang, L Kong, L Liu, H Chen… - … on Device and …, 2022 - ieeexplore.ieee.org
The SiC trench gate lateral MOSFET featuring dual source trenches is proposed in this work.
2D numerical simulations by TCAD are conducted to study the performance and the …

Investigations of SiC lateral MOSFET with high-k and equivalent variable lateral doping techniques

M Kong, H Deng, Y Luo, J Zhu, B Yi, H Yang, Q Hu… - Microelectronics …, 2024 - Elsevier
In this article, a novel high-k and equivalent variable lateral doping 4H-SiC lateral double-
diffused metal oxide semiconductor (LDMOS) field-effect transistor with improved …

Neural Network-based Classification of Breakdown Mechanisms and Prediction of breakdown Voltage and On-resistance for 4H-SiC Trench Gate MOS Devices

J Zhang, S Zhang, Z Sun, Y Wang, Y Wu… - … of Electronics Design …, 2024 - ieeexplore.ieee.org
Since neural networks do not face the convergence issues like TCAD simulations, we
attempted to construct two types of neural networks for numerical prediction and mechanism …