Si-containing film forming precursors and methods of using the same

JM Girard, P Zhang, A Sanchez, M Khandelwal… - US Patent …, 2017 - Google Patents
Mono-substituted TSA precursor Si-containing film forming compositions are disclosed. The
precursors have the for mula:(SiHz) N—SiH, X, wherein X is selected from a halogen atom; …

The influence of carbon on the structure and photoluminescence of amorphous silicon carbonitride thin films

Z Khatami, PRJ Wilson, J Wojcik, P Mascher - Thin Solid Films, 2017 - Elsevier
Silicon carbonitride (SiCN), an intermediate structure between silicon carbide and silicon
nitride, has emerged as a material of interest to increase the performance of silicon-based …

Annealing of silicon carbonitride nanostructured thin films: interdependency of hydrogen content, optical, and structural properties

Z Khatami, C Nowikow, J Wojcik, P Mascher - Journal of Materials Science, 2018 - Springer
Silicon carbonitride (SiC x N y) materials, inspired by their outstanding multifunctional
properties, are finding increasing applications in a variety of fields, including as next …

Investigation of deposition characteristics and properties of high-rate deposited silicon nitride films prepared by atmospheric pressure plasma chemical vapor …

H Kakiuchi, Y Nakahama, H Ohmi, K Yasutake… - Thin Solid Films, 2005 - Elsevier
Silicon nitride (SiNx) films have been prepared at extremely high deposition rates by the
atmospheric pressure plasma chemical vapor deposition (AP-PCVD) technique on Si (001) …

Fabrication of a silicon oxide stamp by edge lithography reinforced with silicon nitride for nanoimprint lithography

Y Zhao, E Berenschot, M De Boer… - Journal of …, 2008 - iopscience.iop.org
The fabrication of a stamp reinforced with silicon nitride is presented for its use in
nanoimprint lithography. The fabrication process is based on edge lithography using …

Analysis of hump effect induced by positive bias temperature instability in the local oxidation of silicon n-MOSFETs

WC Hung, FY Jin, TC Chang, WC Hung… - … on Device and …, 2023 - ieeexplore.ieee.org
In this study, the degradation of the subthreshold swing (SS) and the hump effect are
observed in the local oxidation of silicon (LOCOS) metal-oxide-semiconductor field-effect …

All hot wire CVD TFTs with high deposition rate silicon nitride (3 nm/s)

REI Schropp, S Nishizaki, ZS Houweling, V Verlaan… - Solid-state …, 2008 - Elsevier
Using the hot wire (HW) chemical vapor deposition (CVD) method for the deposition of
silicon nitride (SiNx) and amorphous silicon (a-Si: H) thin films we have achieved high …

Nano-ridge fabrication by local oxidation of silicon edges with silicon nitride as a mask

J Haneveld, E Berenschot, P Maury… - … of micromechanics and …, 2006 - iopscience.iop.org
A method to fabricate nano-ridges over a full wafer is presented. The fabrication method
uses local oxidation of silicon, with silicon nitride as a mask, and wet anisotropic etching of …

A high-activity nitrogen plasma flow source for deposition of silicon nitride films

DQ Shi, W Xu, CY Miao, CY Ma, CS Ren, WQ Lu… - Surface and Coatings …, 2016 - Elsevier
We report a tubular plasma source that is capable of creating high-activity nitrogen plasma
flow at low pressure. The high-activity nitrogen plasma was produced by a continue low …

Hydrogenated amorphous silicon films deposited by electron cyclotron resonance chemical vapor deposition at room temperature with different radio frequency chuck …

HS Alvarez, AR Silva, FH Cioldin, LCJ Espindola… - Thin Solid Films, 2019 - Elsevier
In this work, we present the morphological and electrical characterization of hydrogenated
amorphous siliconfilms, which were deposited at room temperature on an+-type silicon …