[HTML][HTML] Observation of dislocations in thick β-Ga2O3 single-crystal substrates using Borrmann effect synchrotron x-ray topography

Y Yao, K Hirano, Y Sugawara, K Sasaki, A Kuramata… - APL Materials, 2022 - pubs.aip.org
We performed Borrmann effect x-ray topography (XRT) to observe dislocations and other
structural defects in a thick β-Ga 2 O 3 (001) substrate. The Borrmann effect was realized by …

Development of Large‐Diameter and Very High Purity Ge Crystal Growth Technology for Devices

RR Sumathi, A Gybin, KP Gradwohl… - Crystal Research …, 2023 - Wiley Online Library
High‐purity germanium (HPGe) single crystals find their applications as radiation detectors
especially for spectroscopy of high‐energy photons and particles in nuclear physics …

Quantitative dislocation multiplication law for Ge single crystals based on discrete dislocation dynamics simulations

KP Gradwohl, W Miller, N Dropka… - Computational Materials …, 2022 - Elsevier
This is the first report of a quantitative dislocation multiplication law for Ge single crystals
based on discrete dislocation dynamics simulations. The multiplication was studied as a …

Evaluation the nonlinear response function of a HPGe detector for 59 keV to 10.7 MeV gamma-rays using a Monte Carlo simulation and comparison with experimental …

F Saheli, Z Riazi, A Jokar, H Shahabinejad… - Journal of …, 2021 - iopscience.iop.org
Abstract Modeling of High Purity Germanium (HPGe) detector on a wide energy range is
important in gamma-ray spectroscopy. The precisely modeled detector can be used for …

The impact of the dislocation distribution and dislocation type on the charge carrier lifetime in Czochralski germanium single crystals

KP Gradwohl, U Juda, RR Sumathi - Journal of Crystal Growth, 2021 - Elsevier
Germanium crystal grown by the Czochralski method in [2 1 1] and [1 1 0] direction have
been investigated by etching methods and the charge carrier lifetime was analyzed by …

Investigation of the dislocation structure in Czochralski germanium crystals grown in [211] and [110] growth directions

KP Gradwohl, M Roder, AN Danilewsky, RR Sumathi - CrystEngComm, 2021 - pubs.rsc.org
The dislocation structure of single-crystalline germanium crystals grown by the Czochralski
method in [2 1 1] and [1 1 0] directions has been examined by white beam X-ray topography …

Study of Structural Defects in Sapphire Ribbons using X-Ray Topography and Coherent Imaging in Synchrotron Radiation

TS Argunova, VG Kohn, JH Lim, VM Krymov… - Journal of Surface …, 2023 - Springer
The method of X-ray phase contrast imaging has found wide application in coherent-
synchrotron-radiation sources. In this study, this method is used in combination with X-ray …

Complexation in germanium in accordance with Vlasov's model for solids

VI Talanin, IE Talanin - Journal of Crystal Growth, 2020 - Elsevier
Using Vlasov's model for solids, the diffusion model of defect formation in germanium was
verified. The possibility of applying Vlasov's model for solids to describe complexation in …

[图书][B] Growth and defect investigation of high-purity germanium crystals for radiation detector applications

KP Gradwohl - 2021 - search.proquest.com
Abstract Isotopenangereicherte hochreine Germanium (HPGe) Strahlungsdetektorkristalle
mit herausragender chemischen Reinheit und kristalliner Perfektion spielen eine …