Aluminum migration and intrinsic defect interaction in single-crystal zinc oxide

KM Johansen, L Vines, TS Bjørheim, R Schifano… - Physical Review …, 2015 - APS
Vacancy-mediated migration of Al in single-crystal zinc oxide (ZnO) is investigated using
secondary-ion mass spectrometry (SIMS) combined with hybrid density-functional theory …

The effect of millisecond flash lamp annealing on electrical and structural properties of ZnO: Al/Si structures

PF Lindberg, F Lipp Bregolin, K Wiesenhütter… - Journal of Applied …, 2016 - pubs.aip.org
The effect of millisecond flash lamp annealing (FLA) on aluminum doped ZnO (AZO) films
and their interface with Si have been studied. The AZO films were deposited by magnetron …

Modeling and optimization of n-ZnO/p-Si heterojunction using 2-dimensional numerical simulation

M Manoua, T Jannane, O Abouelala… - The European Physical …, 2020 - epjap.org
In this work, n-ZnO/p-Si heterojunction was investigated using two-dimensional numerical
simulation. The effect of Zinc Oxide thickness, carrier concentration in Zinc Oxide layer …

Bulk Growth and Impurities

L Vines, A Kuznetsov - Semiconductors and Semimetals, 2013 - Elsevier
The renewed interest in oxide semiconductors has resulted in a considerable progress in
the material development and in understanding the nature of intrinsic and impurity related …

Comparison of the structural properties of Zn-face and O-face single crystal homoepitaxial ZnO epilayers grown by RF-magnetron sputtering

R Schifano, HN Riise, JZ Domagala… - Journal of Applied …, 2017 - pubs.aip.org
Homoepitaxial ZnO growth is demonstrated from conventional RF-sputtering at 400 C on
both Zn and O polar faces of hydrothermally grown ZnO substrates. A minimum yield for the …

Complementary study of the photoluminescence and electrical properties of ZnO films grown on 4H-SiC substrates

V Khranovskyy, I Shtepliuk, L Vines… - Journal of Luminescence, 2017 - Elsevier
We have studied the photoluminescence and electrical properties of ZnO films grown
epitaxially by atmospheric pressure MOCVD on 4H-SiC substrates. The dominating D° X …

Characterization of N type Si doped ZnO and ZnO thin films deposited by RF magnetron sputtering

J Claypoole, M Altwerger, S Flottman… - 2018 IEEE …, 2018 - ieeexplore.ieee.org
Si doped Zinc oxide (Si-ZnO) thin films were deposited on glass substrates by RF magnetron
co-sputtering Phosphorus doped Si and ZnO. The effect of different n-Si/ZnO wattage ratios …

Diffusjon av potensielle p-type dopantar i monokrystallinsk ZnO

EH Enoksen - 2016 - duo.uio.no
The diffusion of Ag and Cu in monocrystalline ZnO has been investigated by isochronal
annealing and probed with a Secondary ion mass spectrometer. The diffusion was …

[PDF][PDF] Scanning Probe Microscopy-Method Development and Applications to Zinc Oxide Structures

JA Borgersen - 2016 - duo.uio.no
Scanning spreading resistance microscopy (SSRM) and scanning capacitance microscopy
(SCM) are among the few techniques feasible for characterizing electrical properties on the …

Band gap engineering of the ZnO/Si heterojunction using amorphous buffer layers

ME Ingebrigtsen - 2014 - duo.uio.no
Zinc oxide is attractive for photovoltaic applications due to its properties as Transparent
Conductive Oxide (TCO), as well as for rectifying heterojunctions to silicon. The present work …