[图书][B] Through silicon vias: materials, models, design, and performance

BK Kaushik, VR Kumar, MK Majumder, A Alam - 2016 - taylorfrancis.com
Recent advances in semiconductor technology offer vertical interconnect access (via) that
extend through silicon, popularly known as through silicon via (TSV). This book provides a …

VLSI interconnects and their testing: prospects and challenges ahead

DK Sharma, BK Kaushik, RK Sharma - Journal of Engineering, Design …, 2011 - emerald.com
Purpose–The purpose of this paper is to explore the functioning of very‐large‐scale
integration (VLSI) interconnects and modeling of interconnects and evaluate different …

[PDF][PDF] Interconnect coupling noise in CMOS VLSI circuits

KT Tang, EG Friedman - … of the 1999 international symposium on …, 1999 - dl.acm.org
Abstmct-Interconnect between a CMOS driver and receiver can be modeled as a lossy
transmission line in high speed CMOS VLSI circuits as transition times become comparable …

Timing modeling and optimization under the transmission line model

TC Chen, SR Pan, YW Chang - IEEE Transactions on Very …, 2004 - ieeexplore.ieee.org
As the operating frequency increases to gigahertz and the rise time of a signal is less than or
comparable to the time-of-flight delay of a wire, it is necessary to consider the transmission …

Delay and power expressions characterizing a CMOS inverter driving an RLC load

KT Tang, EG Friedman - 2000 IEEE International Symposium …, 2000 - ieeexplore.ieee.org
On-chip parasitic inductance has become an important design issue in high speed
integrated circuits. On-chip inductance may degrade on-chip signal quality, affect …

Lumped versus distributed RC and RLC interconnect impedances

K Tang, EG Friedman - Proceedings of the 43rd IEEE Midwest …, 2000 - ieeexplore.ieee.org
A Fourier analysis of on-chip signals in CMOS integrated circuits is presented in this paper. It
is demonstrated that on-chip signals can be approximated by a Fourier series up to the 15th …

Modelling and evaluation of substrate noise induced by interconnects

F Martorell, D Mateo, X Aragonès - IEE Proceedings-Computers and Digital …, 2003 - IET
Interconnects have received attention as a source of crosstalk to other interconnects, but
have been ignored as a source of substrate noise. The importance of interconnect-induced …

Peak noise prediction in loosely coupled interconnect [VLSI circuits]

KT Tang, EG Friedman - 1999 IEEE International Symposium …, 1999 - ieeexplore.ieee.org
Interconnect in VLSI circuits is best modeled as a lossy transmission line in high speed
integrated circuits. Analytical expressions for the coupling noise between adjacent …

Return path assumption validation for inductance modeling in digital design

L David, C Cregut, F Huret, Y Quere… - IEEE transactions on …, 2007 - ieeexplore.ieee.org
Inductance modeling for on-chip interconnects in a typical digital environment is proposed.
Regarding the effective loop inductance computation, the issue of current return path …

Performance optimization by wire and buffer sizing under the transmission line model

TC Chen, SR Pan, YW Chang - Proceedings 2001 IEEE …, 2001 - ieeexplore.ieee.org
As the operating frequency increases to giga hertz and the rise time of a signal is less than
or comparable to the time-of-flight delay of a line, it is necessary to consider the transmission …