Y Lai, K Pan, S Park - Microelectronics Reliability, 2024 - Elsevier
The evolution of electronic packaging technology towards the adoption of glass substrates marks a significant advancement in overcoming the constraints posed by traditional organic …
JH Lau - … symposium on advanced packaging materials (APM), 2011 - ieeexplore.ieee.org
3D integration consists of 3D IC packaging, 3D IC integration, and 3D Si integration. They are different and in general the TSV (through-silicon via) separates 3D IC packaging from …
A double-sided and ultrathin 3-D glass interposer with through package vias (TPVs) at same pitch as through silicon vias (TSVs) in silicon interposers is developed to provide a …
Modeling and Design of Electromagnetic Compatibility for High-Speed Printed Circuit Boards and Packaging presents the electromagnetic modelling and design of three major …
HK Kannojia, J Arab, BJ Pegu… - Journal of the …, 2019 - iopscience.iop.org
Fabrication and characterization of electrodeposited copper filled through-glass vias (TGV) are demonstrated on full-scale fused silica wafer for the first time by a simple combination of …
R Yoshizaki, Y Ito, K Ogasawara, A Shibata… - Optics & Laser …, 2022 - Elsevier
To use glass as the substrate material in next-generation large-scale integrations and biochips, the high-speed fabrication of high-aspect-ratio microholes is necessary. Transient …
S Takahashi, K Horiuchi, K Tatsukoshi… - 2013 IEEE 63rd …, 2013 - ieeexplore.ieee.org
This study explored Through Glass Via (TGV) Formation Technology by using Focused Electrical Discharging Method for alkali-fee glass which has well matched CTE with Si. 2.5 …
W Tian, S Wu, W Li - Micromachines, 2023 - mdpi.com
With the increasing demand for high-density integration, low power consumption and high bandwidth, creating more sophisticated interconnection technologies is becoming …