We combined reflection difference microscopy, electron transport measurements, and
atomic force microscopy to characterize the mechanical and electrical anisotropy of few …

This review article summarizes new scientific trends in research for metrology of small mass
(1 mg and lower) and small force (10 micronewtons and lower). After a brief introduction to …

With the recent advances in the field of nanotechnology, measurement and manipulation
requirements at the nanoscale have become more stringent than ever before. In atomic force …

A method is presented for calibrating the higher eigenmodes (resonant modes) of atomic
force microscopy cantilevers that can be performed prior to any tip-sample interaction. The …

An analytical model that considers the static behaviour of weighing cells based on the
principle of electromagnetic force compensation (EMFC) is presented. With this model …

Abstract Silver nanowires (Ag NWs) are a promising material for building various sensors
and devices at the nanoscale. However, the fast and precise placement of individual Ag …

Atomic force microscopy (AFM) in liquids can measure a force curve between a probe and a
buried substrate. The shape of the measured force curve is related to hydration structure on …

Most commonly instruments utilizing cantilever-based sensors are equipped with optical
beam deflection (OBD) detectors. The devices utilizing OBD setup are of simple …

Recent years have witnessed an increased demand for a method for precise measurement
of the microstructures of mechanical microparts, microelectromechanical systems …

An experimental setup for performing micro-scratching tasks and measuring the forces
involved in the process is presented in this paper. The main component of the system is a …