MM Hawkeye, MT Taschuk, MJ Brett - 2014 - books.google.com
This book provides a highly practical treatment of Glancing Angle Deposition (GLAD), a thin film fabrication technology optimized to produce precise nanostructures from a wide range of …
Two different formalisms for the homogenization of composite materials containing ellipsoidal inclusions based on Bruggeman's original formula for spherical inclusions can be …
Spectroscopic ellipsometry (SE) is a powerful technique for the characterization of materials, which is able to probe in a sensitive way their nanostructure as well as to get rich information …
Direct laser writing via two photon polymerization has enabled previously unavailable degrees of freedom in the additive fabrication of micro-to-meso scale structures. The …
D Schmidt, AC Kjerstad, T Hofmann… - Journal of Applied …, 2009 - pubs.aip.org
We report on optical, structural, and magnetic properties of two substantially different cobalt nanostructure thin films deposited at an oblique angle of incidence of 85 away from the …
TWH Oates, M Ranjan, S Facsko, H Arwin - Optics Express, 2011 - opg.optica.org
Variable-angle and Mueller matrix spectroscopic ellipsometry are used to determine the effective dielectric tensors of random and aligned silver nanoparticles and nanorods thin …
Unraveling the anisotropic optical properties of nanometer-scale structured thin films is of great interest for both fundamental and applicative perspectives, but can be challenging and …
Generalized ellipsometry measurements were made using 12 orientations of a monoclinic CdWO 4 crystal. Using these measurements and the associated analytical methods …
Optical properties of passivated metal slanted columnar thin films from cobalt within the visible spectral region are reported. Glancing angle deposition is utilized to grow slanted …