Aluminium nitride integrated photonics: a review

N Li, CP Ho, S Zhu, YH Fu, Y Zhu, LYT Lee - Nanophotonics, 2021 - degruyter.com
Integrated photonics based on silicon has drawn a lot of interests, since it is able to provide
compact solution for functional devices, and its fabrication process is compatible with the …

Integrated High-Q Crystalline AlN Microresonators for Broadband Kerr and Raman Frequency Combs

X Liu, C Sun, B Xiong, L Wang, J Wang, Y Han… - ACS …, 2018 - ACS Publications
Development of planar-integrated microresonators with high quality factors (Q's) is crucial for
nonlinear photonics in a robust chip. Compared with silicon and silicon nitride, aluminum …

Aluminum nitride-on-sapphire platform for integrated high-Q microresonators

X Liu, C Sun, B Xiong, L Wang, J Wang, Y Han… - Optics express, 2017 - opg.optica.org
We demonstrate aluminum nitride (AlN) on sapphire as a novel platform for integrated
optics. High-confinement AlN microring resonators are realized by adopting a partially …

Sub-quarter micrometer periodically poled Al0. 68Sc0. 32N for ultra-wideband photonics and acoustic devices

Z Tang, G Esteves, RH Olsson - Journal of Applied Physics, 2023 - pubs.aip.org
In this study, we demonstrate the ability of polarity inversion of sputtered aluminum
scandium nitride thin films through post-fabrication processes with domain widths as small …

Aluminum scandium nitride on 8-inch Si wafers: material characterization and photonic device demonstration

Z Xiong, X Zhang, Z Li, X Liu, Y Qiu, X Zhao… - Optics …, 2024 - opg.optica.org
The anisotropic optical properties of aluminum scandium nitride (Al_1− xScxN) thin films for
both ordinary and extraordinary light are investigated. A quantitative analysis of the band …

Dislocation characterization in c-plane GaN epitaxial layers on 6 inch Si wafer with a fast second-harmonic generation intensity mapping technique

SE Chiang, WH Chang, YT Chen, WC Li… - …, 2023 - iopscience.iop.org
Second harmonic generation (SHG) intensity, Raman scattering stress, photoluminescence
and reflected interference pattern are used to determine the distributions of threading …

High-quality AlN growth: a detailed study on ammonia flow

G Yolcu, MN Koçak, DH Ünal, I Altuntas… - Journal of Materials …, 2023 - Springer
High crystalline and optical quality aluminum nitride (AlN) films with thin thickness have
been grown on Al2O3 by MOVPE (metal-organic vapor phase epitaxy) and the NH3 flow …

A first-principles study of novel cubic AlN phases

C Liu, M Chen, J Li, L Liu, P Li, M Ma, C Shao… - Journal of Physics and …, 2019 - Elsevier
By a first-principles approach combined with an evolutionary method, four novel cubic AlN
phases (cP16, cF40, cI16, and c I24 AlN) are proposed as promising phases after detailed …

Piezoelectric lattice vibrations in binary nitrides at optical frequencies

P Sahare, BK Sahoo - The European Physical Journal Plus, 2022 - Springer
Piezoelectric nature of wurtzite binary nitrides (AlN, GaN and InN) has been extensively
utilized in different devices and experiments from DC to microwaves frequencies. At optical …

Depth profiling and morphological characterization of AlN thin films deposited on Si substrates using a reactive sputter magnetron

C Macchi, J Bürgi, JG Molleja, S Mariazzi… - The European Physical …, 2014 - epjap.org
It is well-known that the characteristics of aluminum nitride thin films mainly depend on their
morphologies, the quality of the film-substrate interfaces and the open volume defects. A …