This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting
with its invention and covering most of the recent developments. Today, dynamic force …

In this report we review the fundamentals, applications and future tendencies of dynamic
atomic force microscopy (AFM) methods. Our focus is on understanding why the changes …

Written by three leading experts in the field, this book describes and explains all essential
aspects of scanning probe microscopy. Emphasis is placed on the experimental design and …

We have developed a low noise cantilever deflection sensor with a deflection noise density
of 17 fm∕ Hz by optimizing the parameters used in optical beam deflection (OBD) method …

True atomic resolution of frequency-modulation atomic force microscopy in liquid is
demonstrated. Hexagonal lattice of a cleaved (001) surface of muscovite mica is resolved in …

Quantitative measurements of frequency shift vs distance curves of ultrahigh-vacuum force
microscopy in a noncontact mode are presented. Different contributions from electrostatic …

Atomically resolved dynamic force microscopy (DFM) images of step and kink sites of NaCl
films grown on the Cu (111) surface are presented. Combining experimental results with an …

Frequency modulation atomic force microscopy is a method for imaging the surface of
metals, semiconductors and insulators in ultrahigh vacuum with true atomic resolution. The …

Ultrathin films of NaCl on Cu (111) have been studied with low-energy electron diffraction
(LEED) and Dynamic force microscopy (DFM). The orientation and the lattice constant of the …

The physics of semiconductors has seen an enormous evolution within the last? fty years.
Countless achievements have been made in scienti? c research and device applications …