An effective silicon debug technique uses a trace buffer to monitor and capture a portion of
the circuit response during its functional, post-silicon operation. Due to the limited space of …

Fingerprint distortion changes both the geometric position and orientation of minutiae, and
leads to difficulties in establishing a match among multiple impressions acquired from the …

Silicon debug with a trace buffer provides real-time visibility to the design under debug. It
traces a small subset of internal signals during its normal operation. The effectiveness of …

Redundant test cases in newly generated test suites often remain undetected until execution
and waste scarce project resources. In model-based testing, the testing process starts early …

Diagnosis of functional failures can be used to debug design issues, isolate manufacturing
defects, and improve manufacturing yield. Automated failure analysis and rapid root-cause …

The capacity of the available on-chip trace buffer is limited. To increase its capacity, we
propose real-time compression of the trace data via novel source transformation functions …

Current silicon test methods are highly effective at sensitizing and propagating most
electrical faults. Unfortunately, with ever increasing chip complexity and shorter time-to …

An effective silicon debug technique uses a trace buffer to monitor and capture a portion of
the circuit response during its functional, post-silicon operation. Due to the limited space of …

In VLSI industry, Si debug is a crucial step of design flow before chipsets reach end users. It
is a challenging phase, especially for complex systems like Microcontrollers and Processors …

Exploiting advanced fault localization methods for yield & reliability learning on
SoCs Page 1 Exploiting Advanced Fault Localization Methods for Yield & Reliability …