Gettering in silicon photovoltaics: A review

AY Liu, SP Phang, D Macdonald - Solar Energy Materials and Solar Cells, 2022 - Elsevier
A key efficiency-limiting factor in silicon-based photovoltaic (PV) devices is the quality of the
silicon material itself. With evolving cell architectures that better address other efficiency-loss …

Iron contamination in silicon technology

AA Istratov, H Hieslmair, ER Weber - Applied Physics A, 2000 - Springer
This article continues the review of fundamental physical properties of iron and its
complexes in silicon (Appl. Phys. A 69, 13 (1999)), and is focused on ongoing applied …

[HTML][HTML] Gettering of interstitial iron in silicon by plasma-enhanced chemical vapour deposited silicon nitride films

AY Liu, C Sun, VP Markevich, AR Peaker… - Journal of Applied …, 2016 - pubs.aip.org
It is known that the interstitial iron concentration in silicon is reduced after annealing silicon
wafers coated with plasma-enhanced chemical vapour deposited (PECVD) silicon nitride …

Experimental and theoretical study of heterogeneous iron precipitation in silicon

A Haarahiltunen, H Väinölä, O Anttila… - Journal of Applied …, 2007 - pubs.aip.org
Heterogeneous iron precipitation in silicon was studied experimentally by measuring the
gettering efficiency of oxide precipitate density of 1× 10 10 cm− 3⁠. The wafers were …

Comprehensive Model for Charge Carrier Recombination in Czochralski‐Grown Silicon Due to Oxygen Precipitation in Industrial Solar Cell Manufacturing

S Maus, S Mack, J Schön, M Meßmer, A Wolf… - Solar RRL, 2023 - Wiley Online Library
Oxygen precipitates are among the most detrimental oxygen‐related silicon bulk defects
formed during solar cell manufacturing. These defects are formed only during high …

Gettering simulator: physical basis and algorithm

H Hieslmair, S Balasubramanian… - Semiconductor …, 2001 - iopscience.iop.org
The basic physical principles and mechanisms of gettering of metal impurities in silicon are
well established. However, a predictive model of gettering that would enable one to …

A comprehensive model for the gettering of lifetime‐killing impurities in silicon

C del Cañizo, A Luque - Journal of The Electrochemical Society, 2000 - iopscience.iop.org
Lifetime-killing impurities are often present in the Si used to manufacture electron devices.
They degrade the performance of electron devices, such as the efficiency in solar cells or the …

Precipitation of iron in multicrystalline silicon during annealing

AY Liu, D Macdonald - Journal of Applied Physics, 2014 - pubs.aip.org
In this paper, the precipitation kinetics of iron in multicrystalline silicon during moderate
temperature annealing are systematically studied with respect to annealing time …

Experimental evidence for the presence of segregation and relaxation gettering of iron in polycrystalline silicon layers on silicon

AA Istratov, W Huber, ER Weber - Applied Physics Letters, 2004 - pubs.aip.org
Experimental evidence is provided that gettering of iron by polycrystalline silicon
(polysilicon) is driven by a combination of two gettering mechanisms, segregation and …

Impact of local atomic stress on oxygen segregation at tilt boundaries in silicon

Y Ohno, K Inoue, K Fujiwara, K Kutsukake… - Applied Physics …, 2017 - pubs.aip.org
Using the atom probe tomography, transmission electron microscopy, and ab initio
calculations, we investigate the three-dimensional distributions of oxygen atoms segregating …