This paper presents the Quick Error Detection (QED) technique for systematically creating
families of post-silicon validation tests that quickly detect bugs inside processor cores and …

During post-silicon validation and debug, manufactured integrated circuits (ICs) are tested in
actual system environments to detect and fix design flaws (bugs). Existing post-silicon …

We present Symbolic Quick Error Detection (Symbolic QED), a structured approach for logic
bug detection and localization which can be used both during pre-silicon design verification …

System-level validation is the most challenging phase of design verification. A common
methodology in this context entails simulating the design under validation in lockstep with a …

Scan-based Design for Testability (DFT) is widely used in industry as it consistently provides
high fault coverage. However, scan-based DFT is prone to security vulnerabilities where …

Long error detection latency, the time elapsed from the occurrence of an error caused by a
bug to its manifestation as an observable failure, severely limits the effectiveness of existing …

A method of operating a test device for a logic-based processing device includes the steps
of providing an original set of test instructions, generating one or more Quick Error Detection …

Existing post-silicon validation techniques are generally ad hoc, and their cost and
complexity are rising faster than design cost. Hence, systematic approaches to post-silicon …

Our quest for faster and efficient computing devices has led us to processor designs with
enormous complexity. As a result, functional verification, which is the process of ascertaining …

During post-silicon validation and debug, one or more manufactured integrated circuits (ICs)
are tested in actual system environments to detect and fix design flaws (bugs). According to …