Interfacial engineering has long been a vital means of improving thin-film device
performance, especially for organic electronics, perovskites, and hybrid devices. It greatly …

The use of peak fitting to extract information from x-ray photoelectron spectroscopy (XPS)
data is of growing use and importance. Due to increased instrument accessibility and …

The carbon 1s photoelectron spectrum is the most widely fit and analyzed narrow scan in the
x-ray photoelectron spectroscopy (XPS) literature. It is, therefore, critically important to adopt …

Assessment of the frequency and nature of erroneous x-ray photoelectron spectroscopy
analyses in the scientific literature | Journal of Vacuum Science & Technology A | AIP …

X-ray photoelectron spectroscopy (XPS) is arguably the most important vacuum technique
for surface chemical analysis, and peak fitting is an indispensable part of XPS data analysis …

The existence of asymmetry in X‐ray photoelectron spectroscopy (XPS) photoemission lines
is widely accepted, but line shapes designed to accommodate asymmetry are generally …

Despite numerous tutorials and standards written to the technical community on X-ray
photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting …

The escalating impact and remarkable progress of nanotechnology have shifted the
paradigms of medicine and the healthcare system. Nanosystems have emerged, extensively …

Low energy ion scattering (LEIS) probes the elemental composition of the outermost atomic
layer of a material and provides static depth profiles of the outer ca. 10 nm of surfaces. Its …

Near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional
form of XPS that allows samples to be analyzed at relatively high pressures, ie, greater than …