From lactic acid to poly (lactic acid)(PLA): characterization and analysis of PLA and its precursors

S Inkinen, M Hakkarainen, AC Albertsson… - …, 2011 - ACS Publications
The quality of the monomers lactic acid and lactide as well as the chemical changes induced
during polymerization and processing are crucial parameters for controlling the properties of …

Cluster secondary ion mass spectrometry of polymers and related materials

CM Mahoney - Mass spectrometry reviews, 2010 - Wiley Online Library
Cluster secondary ion mass spectrometry (cluster SIMS) has played a critical role in the
characterization of polymeric materials over the last decade, allowing for the ability to obtain …

A new dynamic in mass spectral imaging of single biological cells

JS Fletcher, S Rabbani, A Henderson… - Analytical …, 2008 - ACS Publications
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has unique capabilities in the
area of high-resolution mass spectrometric imaging of biological samples. The technique …

TOF-SIMS 3D Biomolecular Imaging of Xenopus laevis Oocytes Using Buckminsterfullerene (C60) Primary Ions

JS Fletcher, NP Lockyer, S Vaidyanathan… - Analytical …, 2007 - ACS Publications
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) using buckminsterfullerene
(C60) as the primary ion source has the ability to generate chemical images of surfaces with …

Secondary ion mass spectrometry: characterizing complex samples in two and three dimensions

JS Fletcher, JC Vickerman - Analytical chemistry, 2013 - ACS Publications
Over the last 10 or so years, developments in molecular se-condary ion mass spectrometry
(SIMS) have taken its capability into areas previously only demonstrated in dynamic SIMS …

Mass spectrometry of synthetic polymers

SM Weidner, S Trimpin - Analytical chemistry, 2010 - ACS Publications
The heart of this review is to give a compact overview of the literature on mass spectrometry
(MS) of polymers published in the time period from 2008 to 2009. Identical to the review from …

Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study

AG Shard, R Havelund, MP Seah, SJ Spencer… - Analytical …, 2012 - ACS Publications
The depth profiling of organic materials with argon cluster ion sputtering has recently
become widely available with several manufacturers of surface analytical instrumentation …

ToF-SIMS Depth Profiling of Cells: z-Correction, 3D Imaging, and Sputter Rate of Individual NIH/3T3 Fibroblasts

MA Robinson, DJ Graham, DG Castner - Analytical chemistry, 2012 - ACS Publications
Proper display of three-dimensional time-of-flight secondary ion mass spectrometry (ToF-
SIMS) imaging data of complex, nonflat samples requires a correction of the data in the z …

Developments in molecular SIMS depth profiling and 3D imaging of biological systems using polyatomic primary ions

JS Fletcher, NP Lockyer… - Mass spectrometry …, 2011 - Wiley Online Library
In principle mass spectral imaging has enormous potential for discovery applications in
biology. The chemical specificity of mass spectrometry combined with spatial analysis …

High energy gas cluster ions for organic and biological analysis by time-of-flight secondary ion mass spectrometry

TB Angerer, P Blenkinsopp, JS Fletcher - International Journal of Mass …, 2015 - Elsevier
There is considerable excitement surrounding the application of gas cluster ion beams
(GCIBs) for SIMS analysis in order to study organic materials and biological samples such …