To scale the ferroelectric random access memory (FeRAM) technology toward 28 nm or beyond, it is critical to develop stacked capacitor (with sufficient surface area) to allow good …
Ferroelectric Hf 0.5 Zr 0.5 O 2 (HZO) thin film has obtained considerable attention for emerging non-volatile memory (eNVM) and synaptic device applications. To our best …
Scaling in area and voltage and its interplay with reliability of metal-ferroelectric-metal (MFM) capacitors are explored for scalable embedded FeRAM technology below 2× nm …
B Chen, C Wang, X Zhan, S Wu, L Tai, J Mei… - …, 2023 - iopscience.iop.org
To break the von Neumann bottleneck, emerging non-volatile memories have gained extensive attention in hardware implementing neuromorphic computing. The device scaling …
Hf 0.5 Zr 0.5 O 2 (HZO) ferroelectric random access memory (FeRAM) has been demonstrated in 130 nm node with 1T1C structure. To scale FeRAM to 28 nm or beyond, a …
Z Fu, K Wang, S Xu, Q Huang… - IEEE Electron Device …, 2023 - ieeexplore.ieee.org
In this work, with the consideration of pulsing sequence of FeRAM operation, the impacts of hafnia-based ferroelectric (FE) dynamics on polarization switching and memory window …
KK Min, HM Kim, Y Kim, C Kim, J Yu… - IEEE Electron …, 2022 - ieeexplore.ieee.org
In the last decade, a surge in research on hafnium oxide (HfO x)-based ferroelectricity has become a significant part of the semiconductor research trend. In this work, we present a …
RH Koo, W Shin, S Ryu, S Kim, G Jung… - IEEE Electron …, 2024 - ieeexplore.ieee.org
We investigate domain wall (DW) movement in hafnium zirconium oxide (HZO) under various temperature () and cycling stresses. It is demonstrated that cycling stress distinctly …