Abstract Run-to-run (R2R) control is widely used in semiconductor manufacturing systems to
minimize the process drift, shift and variability. The R2R controller adjusts control actions or …

In this paper, an extended state observer (ESO)-based run to run (RtR) controller is
presented to suppress various stochastic disturbances emerging in the semiconductor …

Time delay is a common phenomenon in robotic systems due to computational requirements
and communication properties between or within high-level and low-level controllers as well …

For an electric power assist steering (EPAS) control system, it is important to know the rack
force information to improve the steering feel control performance. Since there is no direct …

Bu çalışmada, bir yongalevha işletmesinde kalitenin iyileştirilmesi ve maliyetlerin azaltılması
amacıyla İstatistiksel Kalite Kontrol (İKK) kartları ve Yapay Sinir Ağları (YSA) birlikte …

A dynamic predictor is proposed for linear time invariant disturbed systems with delay in the
control input. The proposed dynamic predictor has a structure similar to the Luenberger …

In this study, control charts were prepared using data received from a particleboard
manufacturer to determine the factors that impair quality, and the most suitable control charts …