Virtual metrology as an approach for product quality estimation in Industry 4.0: a systematic review and integrative conceptual framework
PA Dreyfus, F Psarommatis, G May… - International Journal of …, 2022 - Taylor & Francis
Virtual metrology (VM) involves estimating a product's quality directly from production
process data without physically measuring it. This enables the product quality of each unit of …
process data without physically measuring it. This enables the product quality of each unit of …
Virtual metrology for enabling zero-defect manufacturing: a review and prospects
Y Zhang, L Li, Q Yu - The International Journal of Advanced Manufacturing …, 2024 - Springer
The ultimate objective of “Zero-Defect Manufacturing,” as a new growth step of Industry 4.0,
is to significantly increase product yield and eventually accomplish zero-defect. For product …
is to significantly increase product yield and eventually accomplish zero-defect. For product …
Convolutional neural networks for automatic virtual metrology
YM Hsieh, TJ Wang, CY Lin, LH Peng… - IEEE Robotics and …, 2021 - ieeexplore.ieee.org
To ensure stable manufacturing and high yield of production, factories (eg, semiconductor or
TFT-LCD fabs) conduct quality inspection on workpieces. They tend to adopt sampling …
TFT-LCD fabs) conduct quality inspection on workpieces. They tend to adopt sampling …
Multi-source AdaBoost with cross-weight method for virtual metrology in semiconductor manufacturing
In the context of Industry 4.0, many production scenarios utilise sensors to monitor
manufacturing processes, resulting in massive data that can be leveraged to build machine …
manufacturing processes, resulting in massive data that can be leveraged to build machine …
面向制造过程的虚拟量测技术综述与展望
李莉， 张雅瑄， 于青云 - 信息与控制, 2023 - xk.sia.cn
“零缺陷制造” 作为工业4.0 的拓展, 致力于大幅提升产品良率并最终实现产品零瑕疵. 目前,
工业过程通常采取物理检测方式对产品进行质量检验, 属于离线破坏性试验且检测成本高昂 …
工业过程通常采取物理检测方式对产品进行质量检验, 属于离线破坏性试验且检测成本高昂 …
[PDF][PDF] 基于点云驱动的DD 马达端面全跳动测量
周虎， 舒登登， 吴重军， 王琪冰 - Laser & Optoelectronics …, 2023 - researching.cn
摘要direct driver (DD) 马达的端面全跳动直接影响着其定位精度. 由于端面全跳动测量复杂,
实际生产中一般使用千分表测量其端面跳动来近似替代. 此方法易损坏被测物的表面 …
实际生产中一般使用千分表测量其端面跳动来近似替代. 此方法易损坏被测物的表面 …
Virtual metrology applied to milling process
PAAP Dreyfus - 2022 - infoscience.epfl.ch
Production quality and process efficiency are the two main drivers that lead any industrial
strategy. To ensure product quality, a duality historically existed between two approaches …
strategy. To ensure product quality, a duality historically existed between two approaches …