Stabilization and Band-Gap Tuning of the 1T-MoS2 Monolayer by Covalent Functionalization

Q Tang, D Jiang - Chemistry of Materials, 2015 - ACS Publications
The MoS2 monolayer is the second most studied two-dimensional material after graphene.
However, the covalent chemistry through the S layers has not been fully explored for …

Microwave microscopy and its applications

Z Chu, L Zheng, K Lai - Annual Review of Materials Research, 2020 - annualreviews.org
Understanding the nanoscale electrodynamic properties of a material at microwave
frequencies is of great interest for materials science, condensed matter physics, device …

Near-field optical imaging and spectroscopy of 2D-TMDs

Y Kim, J Kim - Nanophotonics, 2021 - degruyter.com
Two-dimensional transition metal dichalcogenides (2D-TMDs) are atomically thin
semiconductors with a direct bandgap in monolayer thickness, providing ideal platforms for …

Uncovering edge states and electrical inhomogeneity in MoS2 field-effect transistors

D Wu, X Li, L Luan, X Wu, W Li… - Proceedings of the …, 2016 - National Acad Sciences
The understanding of various types of disorders in atomically thin transition metal
dichalcogenides (TMDs), including dangling bonds at the edges, chalcogen deficiencies in …

Spatially Resolved Persistent Photoconductivity in MoS2–WS2 Lateral Heterostructures

S Berweger, H Zhang, PK Sahoo, BM Kupp… - ACS …, 2020 - ACS Publications
The optical and electronic properties of 2D semiconductors are intrinsically linked via the
strong interactions between optically excited bound species and free carriers. Here we use …

Nondestructive imaging of atomically thin nanostructures buried in silicon

G Gramse, A Kölker, T Lim, TJZ Stock, H Solanki… - Science …, 2017 - science.org
It is now possible to create atomically thin regions of dopant atoms in silicon patterned with
lateral dimensions ranging from the atomic scale (angstroms) to micrometers. These …

Probing resistivity and doping concentration of semiconductors at the nanoscale using scanning microwave microscopy

E Brinciotti, G Gramse, S Hommel, T Schweinboeck… - Nanoscale, 2015 - pubs.rsc.org
We present a new method to extract resistivity and doping concentration of semiconductor
materials from Scanning Microwave Microscopy (SMM) S11 reflection measurements. Using …

Imaging carrier inhomogeneities in ambipolar tellurene field effect transistors

S Berweger, G Qiu, Y Wang, B Pollard, KL Genter… - Nano …, 2019 - ACS Publications
The development of van der Waals (vdW) homojunction devices requires materials with
narrow bandgaps and simultaneously high hole and electron mobilities for bipolar transport …

Noninvasive imaging method of microwave near field based on solid-state quantum sensing

B Yang, Y Dong, ZZ Hu, GQ Liu… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
In this paper, we propose a noninvasive method of imaging the microwave (MW) near field
using a diamond containing nitrogen-vacancy (NV) centers. We applied a synchronization …

Nanoscale surface photovoltage mapping of 2D materials and heterostructures by illuminated Kelvin probe force microscopy

MJ Shearer, MY Li, LJ Li, S Jin… - The Journal of Physical …, 2018 - ACS Publications
Nanomaterials are interesting for a variety of applications, such as optoelectronics and
photovoltaics. However, they often have spatial heterogeneity, ie, composition change or …