Reliability acceptance sampling plans for the Weibull distribution under accelerated Type-I censoring
M Kim, BJ Yum - Journal of Applied Statistics, 2009 - Taylor & Francis
Type-I censored reliability acceptance sampling plans (RASPs) are developed for the
Weibull lifetime distribution with unknown shape and scale parameters such that the …
Weibull lifetime distribution with unknown shape and scale parameters such that the …
A practical application of quantitative accelerated life testing in power systems engineering
MD Turner - IEEE Transactions on Reliability, 2010 - ieeexplore.ieee.org
Demonstrating product reliability is a common challenge within industry, and one that has
become continuously more difficult to address due to the marketplace demands for …
become continuously more difficult to address due to the marketplace demands for …
Equivalent step-stress accelerated life tests with log-location-scale lifetime distributions under Type-I censoring
CH Hu, RD Plante, J Tang - IIE Transactions, 2015 - Taylor & Francis
Accelerated Life Testing (ALT) is used to provide timely estimates of a product's lifetime
distribution. Step-Stress ALT (SSALT) is one of the most widely adopted stress loadings and …
distribution. Step-Stress ALT (SSALT) is one of the most widely adopted stress loadings and …
[图书][B] Beanspruchungsgerechte Bestimmung des Weibull-Formparameters für Zuverlässigkeitsprognosen
J Juskowiak - 2017 - elib.uni-stuttgart.de
Beanspruchungsgerechte Bestimmung des Weibull-Formparameters für
Zuverlässigkeitsprognosen Page 1 UNI STUTTGART Jochen Juskowiak …
Zuverlässigkeitsprognosen Page 1 UNI STUTTGART Jochen Juskowiak …
[PDF][PDF] 基于序进应力加速试验评价器件寿命的方法
郭春生， 李志国， 马卫东， 谢雪松， 程尧海 - 北京工业大学学报, 2007 - journal.bjut.edu.cn
基于对序进应力加速寿命试验的研究, 提出了一种快速确定半导体器件寿命的方法,
建立了理论模型. 以样品3cGl20 为例, 进行了175~ 345℃ 范围内的序进应力加速寿命试验 …
建立了理论模型. 以样品3cGl20 为例, 进行了175~ 345℃ 范围内的序进应力加速寿命试验 …
基于紧缩阈值加速退化试验的长寿命产品可靠性评估
冯静 - 电子学报, 2011 - ejournal.org.cn
对于退化失效型产品, 当产品的特性参数超过给定阈值时即发生失效, 失效阈值定义越严格则对
产品功能要求越高, 则产品越容易发生因不满足该功能要求而失效, 可见产品的寿命数据与失效 …
产品功能要求越高, 则产品越容易发生因不满足该功能要求而失效, 可见产品的寿命数据与失效 …
Hybrid reliability assessment for packaging prototyping
H Lu, J Zhou, R Golek, M Zhou - Microelectronics Reliability, 2005 - Elsevier
The paper presents a physics-based hybrid approach to assist the assessment of thermally
induced packaging reliability. This method is applicable to prototypes at different stages of …
induced packaging reliability. This method is applicable to prototypes at different stages of …
[PDF][PDF] Empirical timing analysis of CPUs and delay fault tolerant design using partial redundancy
S Chang - 2010 - core.ac.uk
The operating clock frequency is determined by the longest signal propagation delay,
setup/hold time, and timing margin. These are becoming less predictable with the increasing …
setup/hold time, and timing margin. These are becoming less predictable with the increasing …