Dispersal at hydrothermal vents: a summary of recent progress

PA Tyler, CM Young - Hydrobiologia, 2003 - Springer
The discovery of hydrothermal vents along the Galapagos Rift in 1977 opened up one of the
most dynamic and productive research themes in marine biology. In the intervening 25 …

Silicon nitride deposition: Impact on lifetime and light-induced degradation at elevated temperature in multicrystalline silicon

J Lindroos, A Zuschlag, D Skorka… - IEEE Journal of …, 2019 - ieeexplore.ieee.org
Light and elevated temperature induced degradation (LeTID) in multicrystalline (mc) silicon
(Si) is known to be sensitive to the silicon nitride (SiN x: H) deposition and the firing, but the …

Effects of carbon on phosphorus diffusion in SiGe: C and the implications on phosphorus diffusion mechanisms

Y Lin, H Yasuda, M Schiekofer, B Benna… - Journal of Applied …, 2014 - pubs.aip.org
The use of carbon (C) in SiGe base layers is an important approach to control the base layer
dopant phosphorus (P) diffusion and thus enhance PNP heterojunction bipolar transistor …

Study of fluorine behavior in silicon by selective point defect injection

MN Kham, HAW El Mubarek, JM Bonar… - Applied Physics …, 2005 - pubs.aip.org
This letter reports a point defect injection study of 185 keV 2.3× 10 15 cm− 2 fluorine
implanted silicon. After an inert anneal at 1000 C⁠, fluorine peaks are seen at depths of 0.3 …

Dopant diffusion in SiGeC alloys

H Rucker, B Heinemann, R Kurps… - ECS …, 2006 - iopscience.iop.org
In this paper, we discuss the impact of germanium and carbon on the diffusion of common
dopants in Si-based alloys. We review results of various diffusion experiments and discuss …

Modeling vacancy injection from the silicon/silicon-nitride interface

M Hasanuzzaman, YM Haddara - Journal of Materials Science: Materials …, 2008 - Springer
Vacancy injection is known to occur from the silicon/silicon-nitride interface under conditions
of thermal nitridation and during anneal in inert or oxidizing ambients in the presence of a …

[HTML][HTML] Void Evolution And Defect Interactions In Silicon And Silicon Germanium

M Hasanuzzaman - 2012 - researchgate.net
We propose a physically based model that describes the density and size of voids in silicon
introduced via high dose helium ion implantation and subsequent annealing. The model …

Suppression of boron diffusion due to carbon during rapid thermal annealing of SiGe based device materials—some comments

MSA Karunaratne, JM Bonar, P Ashburn… - Journal of materials …, 2006 - Springer
The development of silicon-germanium alloys to extend the range of silicon high-frequency
circuits has highlighted the need to understand diffusion mechanisms in this important …

The effects of thermal nitridation on phosphorus diffusion in strained SiGe and SiGe: C

Y Lin, H Yasuda, M Schiekofer, G Xia - Journal of materials science, 2016 - Springer
We investigated the thermal nitridation effects on phosphorus (P) diffusion in strained Si 1− x
Ge x and strained Si 1− x Ge x: C y with up to 18% germanium and 0.09% carbon. P …

Base doping profile control for SiGe PNP HBTs

L Yiheng - 2016 - open.library.ubc.ca
The aim of this thesis is to investigate three aspects related to phosphorus diffusion for
doping profile control in PNP SiGe HBTs: We systematically and quantitatively investigated …