Practical implementation of dynamic methods for measuring atomic force microscope cantilever spring constants

SM Cook, TE Schäffer, KM Chynoweth… - …, 2006 - iopscience.iop.org
Measurement of atomic force microscope cantilever spring constants (k) is essential for
many of the applications of this versatile instrument. Numerous techniques to measure k …

Opportunities in high‐speed atomic force microscopy

BP Brown, L Picco, MJ Miles, CFJ Faul - Small, 2013 - Wiley Online Library
The atomic force microscope (AFM) has become integrated into standard characterisation
procedures in many different areas of research. Nonetheless, typical imaging rates of …

Analysis of DNA interactions using single-molecule force spectroscopy

M Ritzefeld, V Walhorn, D Anselmetti, N Sewald - Amino acids, 2013 - Springer
Protein–DNA interactions are involved in many biochemical pathways and determine the
fate of the corresponding cell. Qualitative and quantitative investigations on these …

Improved measurement accuracy of the quadrant detector through improvement of linearity index

S Cui, YC Soh - Applied Physics Letters, 2010 - pubs.aip.org
This paper presents a set of formulae for estimating the beam position projected on a
quadrant detector (QD). Our new formulae are designed through a systematic procedure to …

The noise of coated cantilevers

A Labuda, JR Bates, PH Grütter - Nanotechnology, 2011 - iopscience.iop.org
In atomic force microscopy, cantilevers with a reflective coating are often used to reduce
optical shot noise for deflection detection. However, static AFM experiments can be limited …

Scanning probe microscopy

MA Poggi, LA Bottomley, PT Lillehei - Analytical chemistry, 2002 - ACS Publications
Scanning probe microscopy (SPM) encompasses a family of techniques that measure
surface topography and surface properties on the atomic scale. The number of papers …

Force spectroscopy with a large dynamic range using small cantilevers and an array detector

TE Schäffer - Journal of applied physics, 2002 - pubs.aip.org
The important characteristics of a detector for force spectroscopy measurements are
sensitivity, linearity and dynamic range. The commonly used two-segment detector that …

Combined voltage-clamp and atomic force microscope for the study of membrane electromechanics

A Beyder, F Sachs - Scanning Probe Microscopy of Functional Materials …, 2010 - Springer
Electromechanical and mechanoelectrical transduction (MEM) by membranes are general
properties and that have probably been utilized by evolution in the design of sensors. To …

High‐Speed Atomic Force Microscopy of Biomolecules in Motion

TE Schäffer - Force Microscopy: Applications in Biology and …, 2006 - Wiley Online Library
“Time is the Life of the Soul,” HW Longfellow wrote in Hyperion (Longfellow, 1839). With
regard to atomic force microscopy (AFM) in biology and medicine,“Time is the Soul of Life” …

SCANNING PROBE ARRAYS FOR NANOSCALE IMAGING, SENSING, AND MODIFICATION

C SANTSCHI, J POLESEL-MARIS… - Nanofabrication …, 2008 - World Scientific
Nowadays tools based on Scanning Probe Methods (SPM) have become indispensable in a
wide range of applications such as cell imaging and spectroscopy, profilometry, or surface …