Gallium nitride (GaN) is a wide bandgap semiconductor material and is the most popular material after silicon in the semiconductor industry. The prime movers behind this trend are …
The current status of ion beam processing of GaN is reviewed. In particular, we discuss the following aspects of ion implantation into GaN:(i) damage build-up and amorphization,(ii) …
V Cimalla, J Pezoldt, O Ambacher - Journal of Physics D: Applied …, 2007 - iopscience.iop.org
With the increasing requirements for microelectromechanical systems (MEMS) regarding stability, miniaturization and integration, novel materials such as wide band gap …
Mechanochemical reactions of the GaN-Al 2 O 3 interface offer a novel principle for scientific and technological merits in the micro-/nano-scale ultra-precision surface machining. In this …
J Guo, C Xiao, J Gao, G Li, H Wu, L Chen, L Qian - Tribology International, 2021 - Elsevier
Mechanical activation in mechanical removal of GaN using diamond tip and mechanochemical removal using Al 2 O 3 tip are described by the Archard equation and …
CY Nam, P Jaroenapibal, D Tham, DE Luzzi, S Evoy… - Nano …, 2006 - ACS Publications
The diameter-dependent Young's modulus, E, and quality factor, Q, of GaN nanowires were measured using electromechanical resonance analysis in a transmission electron …
L Wang, W Wang, RJE Hueting… - … on Power Electronics, 2022 - ieeexplore.ieee.org
Due to their superior material properties, wide bandgap (WBG) semiconductors enable the application of power electronics at higher temperature operation, higher frequencies, and …
X Jiang, J Zhao, X Jiang - Computational materials science, 2011 - Elsevier
From a statistical manner, we collected and correlated experimental bulk (B), shear (G), Young's modulus (E), and ductility (G/B) with Vickers hardness (Hv) for a number of covalent …
A Krost, A Dadgar, G Strassburger… - physica status solidi …, 2003 - Wiley Online Library
We present an in situ method for the determination of the stress in GaN layers on hetero‐ substrates, in particular Si, via measuring the wafer curvature. For device application it is …