Reliability prediction and growth studies—How accurate and useful?

Burn-in

F Jensen, NE Petersen - A Wiley-Interscience Publication, 1982 - eps.ieee.org
This power dissipation capability of thermal solutions is often a function of a few main drivers
such as the cooling technology utilized as well as the overall die size that needs to be …
被引用次数：419 相关文章 所有 3 个版本

Reliability growth models for hardware and software systems based on nonhomogeneous Poisson processes: a survey

S Yamada, S Osaki - Microelectronics Reliability, 1983 - Elsevier
We summarize the reliability growth models for hardware and software systems described
by a stochastic process, where the underlying stochastic process is assumed to be a …
被引用次数：93 相关文章 所有 2 个版本

Reliability growth: a survey

BS Dhillon - Microelectronics Reliability, 1980 - Elsevier
RELIABILITY GROWTH: A SURVEY Page 1 Microelectron. Reliah. Vol. 20, pp. 743 751 0026
2714/80/1001 0743502.00/0 © Pergamon Press Lid. 1980. Printed in Great Britain RELIABILITY …
被引用次数：21 相关文章 所有 3 个版本
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[HTML][HTML] An overview of reliability growth models and their potential use for NASA applications

VS Taneja - 1992 - books.google.com
This study provides an overview of reliability growth literature over the last 25 years. This
includes a thorough literature review of the different areas of applications of reliability growth …
被引用次数：6 相关文章 所有 5 个版本

[引用][C] Design of systems and circuits for maximum reliability or maximum production yield

PW Becker, F Jensen - 1977 - dl.acm.org
Design of Systems and Circuits for Maximum Reliability or Maximum Production Yield | Guide
books skip to main content ACM Digital Library home ACM home Google, Inc. (search) …
被引用次数：64 相关文章 所有 3 个版本