GNSS receiver for Q-Sat and its analysis of precise orbit determination

Y Cai, Z Wang - Acta Astronautica, 2022 - Elsevier
The Earth's gravity field and upper atmosphere are very important scientific information and
their mechanical models can be obtained by inversion of the satellite precision orbit. It would …

Radiation-aware analog circuit design via fully-automated simulation environment

OY Muhikanci, K Ozanoglu, E Afacan, MB Yelten… - Integration, 2023 - Elsevier
As a result of increased interest in space applications, radiation-aware circuit design has
become a major concern to guarantee the safe operation of electronic systems operating …

Repairable Polymer Solid Electrolyte Gated MoS2 Field Effect Devices with Large Radiation Tolerance

D Chen, J Li, Z Wei, X Wei, M Zhu, J Liu… - Advanced Electronic …, 2022 - Wiley Online Library
As human activities expand into naturally or man‐made radiation‐prone environment, the
need for radiation‐hardened (Rad‐Hard) electronic hardware surges. The state‐of‐the‐art …

Total Ionizing Dose Effect and Radiation Hardness Analysis on Low-Leakage ESD Devices Fabricated on Double SOI Technology

C Zhang, F Liu, X Li, S Chen, L Shu… - … on Electron Devices, 2024 - ieeexplore.ieee.org
The impact of the total ionizing dose (TID) on low leakage electrostatic discharge (ESD)
protection devices fabricated on the 180-nm double silicon on insulator (DSOI) technology is …

Design and Validation of a V-Gate n-MOSFET-Based RH CMOS Logic Circuit with Tolerance to the TID Effect

D Ki, M Lee, N Lee, S Cho - Electronics, 2023 - mdpi.com
This study designed a radiation-hardened (RH) complementary metal oxide semiconductor
(CMOS) logic circuit based on an RH variable-gate (V-gate) n-MOSFET that was resistant to …

L style n-MOSFET layout for mitigating TID effects

M Malik, NR Prakash, A Kumar, HS Jatana - Silicon, 2022 - Springer
This paper proposes a new rad hard layout L style of nmos metal oxide semiconductor field
effect transistor (n-MOSFET), which is evaluated to show that its efficacy at reducing …

Breakdown voltage shift mechanism analysis of bi-directional ESD protection device after total ionizing dose test

L Zhongyu, Z Daohong, M Zhen - 2022 International EOS/ESD …, 2022 - ieeexplore.ieee.org
In this paper, a bidirectional electrostatic discharge (ESD) protection device based on HV
CMOS SOI technology was designed for space applications in a radiation environment. Test …

Radiation-hardened and Repairable MoS Field Effect Devices with Polymer Solid Electrolyte Gates

D Chen, J Li, Z Wei, X Wei, M Zhu, J Liu… - arXiv preprint arXiv …, 2021 - arxiv.org
As human activities expand into naturally or man-made radiation-prone environment, the
need for radiation-hardened (Rad-Hard) electronic hardware surged. The state-of-the-art …

심층신경망을이용한Total Ionizing Dose 및Displacement Defect 에의한Saddle Fin DRAM 의열화특성예측

류민상, 하종현, 이경엽, 서민기, 방민지, 이다복… - 전자공학회 …, 2023 - dbpia.co.kr
본 논문에서는 saddle fin dynamic random access memory (DRAM) 에 대한 total ionizing
dose (TID) 와 displacement defect (DD) 영향을 Technology Computer-Aided Design (TCAD) …

Influence of Electrical Stress on Total Dose Radiation Effect of the Strained Si Nano Nmosfet

M Hao, J Li, Y Wang, D Chen, H Wu, Z Wen… - Available at SSRN … - papers.ssrn.com
Base on Carrier transport mechanism of strained Si Nano N-type metal oxide semiconductor
field-effect transistor (NMOSFET) under γ-ray irradiation conditions, which revealed the …