Physical unclonable functions (PUFs) have emerged as a promising security primitive for
low-cost authentication and cryptographic key generation. However, PUF stability with …

Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-
induced process variation has significant impact on circuit performance and reliability …

This paper presents an integrated framework, together with control policies, for optimizing
dynamic control of self-tuning parameters of a digital system over its lifetime in the presence …

With the rise of Internet of Things (IoT), devices such as smartphones, embedded medical
devices, smart home appliances, as well as traditional computing platforms such as …

Negative Bias Temperature Instability (NBTI) has become an important reliability issue in
modern semiconductor processes. Recent work has attempted to address NBTI-induced …

Dependence analysis is useful for software maintenance because it indicates the possible
effects of a software modification on the rest of a program. This helps the software maintainer …

Randomness in Negative Bias Temperature Instability (NBTI) process poses a dramatic
challenge on reliability prediction of digital circuits. Accurate statistical aging prediction is …

Variations in the number and characteristics of charges or traps contributing to transistor
degradation lead to a distribution of device “ages” at any given time. This issue is well …

Effectively confronting device and circuit parameter variations to maintain or improve the
design of high performance and energy efficient systems while satisfying historical …

Physically Unclonable Functions (PUFs) have emerged as a promising security primitive for
low-cost authentication and cryptographic key generation. However, PUF stability with …