Machine learning is among the greatest advancements in computer science and
engineering and is today used to classify or detect objects, a key feature in autonomous …

Extensive research efforts are being carried out to evaluate and improve the reliability of
computing devices either through beam experiments or simulation-based fault injection …

Fault injection in early microarchitecture-level simulation CPU models and beam
experiments on the final physical CPU chip are two established methodologies to access the …

Microprocessor power consumption and dependability are both crucial challenges that
designers have to cope with due to shrinking feature sizes and increasing transistor counts …

This article aims to provide a survey of modeling and simulation of single-event effects
(SEEs) in digital electronics at device, circuit, and system levels. It primarily focuses on the …

Virtual platform frameworks have been extended to allow earlier soft error analysis of more
realistic multicore systems (ie, real software stacks and state-of-the-art ISAs). The high …

The continuous scaling of electronic components has led to the development of high-
performance microprocessors which are even suitable for safety-critical applications where …

Embedded processors are widely used in critical applications such as space missions,
where reliability is mandatory for the success of missions. Due to the increasing application …

In this paper, we investigate the impact of register file errors in modern embedded
microprocessors reliability through fault-injection and heavy-ion experiments. Additionally …

This paper presents an analysis of the efficiency of traditional fault-tolerance methods on
parallel systems running on top of Linux OS. It starts by studying the occurrence of software …