Low dielectric constant materials for microelectronics

K Maex, MR Baklanov, D Shamiryan, F Lacopi… - Journal of Applied …, 2003 - pubs.aip.org
The ever increasing requirements for electrical performance of on-chip wiring has driven
three major technological advances in recent years. First, copper has replaced Aluminum as …

Adhesion at metal–ZrO2 interfaces

MC Munoz, S Gallego, JI Beltrán, J Cerdá - Surface Science Reports, 2006 - Elsevier
This article reviews the present state of research on metal–zirconia interfaces. Interfaces
play a crucial role in establishing the macroscopic properties and performance of zirconia …

The importance of entanglements in optimizing the mechanical and electrical performance of all-polymer solar cells

N Balar, JJ Rech, R Henry, L Ye, H Ade… - Chemistry of …, 2019 - ACS Publications
Organic solar cells that have all-polymer active layers may have several advantages
compared with polymer–small molecule systems including improved mechanical and …

Impact of near-surface thermal stresses on interfacial reliability of through-silicon vias for 3-D interconnects

SK Ryu, KH Lu, X Zhang, JH Im, PS Ho… - IEEE Transactions on …, 2010 - ieeexplore.ieee.org
Continual scaling of on-chip wiring structures has brought significant challenges for
materials and processes beyond the 32-nm technology node in microelectronics. Recently …

Semiconductor crystal islands for three-dimensional integration

F Crnogorac, S Wong, RFW Pease - Journal of Vacuum Science & …, 2010 - pubs.aip.org
The critical operation needed to achieve monolithic three-dimensional integrated circuits is
obtaining single-crystal, device-quality semiconductor material for upper layer active circuits …

Relationship between interfacial adhesion and electromigration in Cu metallization

MW Lane, EG Liniger, JR Lloyd - Journal of Applied Physics, 2003 - pubs.aip.org
A relationship between the adhesion of a Cu conductor to its surrounding medium, the
electromigration drift velocity, and lifetime in a conventional electromigration test has been …

Some issues in cohesive surface modeling

A Needleman - Procedia IUTAM, 2014 - Elsevier
A cohesive surface theory of fracture is a phenomenological continuum framework that is
closely related to classical fracture mechanics. As such it shares the advantages and …

Effects of Ag content on fracture resistance of Sn–Ag–Cu lead-free solders under high-strain rate conditions

D Suh, DW Kim, P Liu, H Kim, JA Weninger… - Materials Science and …, 2007 - Elsevier
Effects of Ag content on fracture resistance of Sn–Ag–Cu solders under high-strain rate
conditions are examined in an attempt to optimize bulk properties of solders for enhanced …

Adhesion energies of Cr thin films on polyimide determined from buckling: Experiment and model

MJ Cordill, FD Fischer, FG Rammerstorfer, G Dehm - Acta materialia, 2010 - Elsevier
For the realization of flexible electronic devices, the metal–polymer interfaces upon which
they are based need to be optimized. These interfaces are prone to fracture in such systems …

[图书][B] Diffusion processes in advanced technological materials

D Gupta - 2010 - books.google.com
My 12-year-old granddaughter Nina Alesi once asked me," Grandpa, you are a scientist at
IBM, so what do you do?" I tried to reply," Oh, I watch atoms move..." But before I could finish …