Some of the simplest and most effective fault diagnosis procedures for scan circuits use
scoring algorithms for associating a number, called a score, with every modeled fault they …

We propose to achieve and maintain ultra-high quality of digital circuits on a per-design
basis by (i) monitoring the type of failures that occur through volume diagnosis, and (ii) …

This paper describes a method for improving the test quality of digital circuits on a per-
design basis by: 1) monitoring the defect behaviors that occur through volume diagnosis; …

A new way of fault collapsing for effect-cause diagnosis is presented. In contrast to existing
dominance-based methods which operate on a pair of faults, the proposed method operates …

In this paper we present a new technique to speed up the effect-cause defect diagnosis by
using a dictionary of very small size. In the proposed method, a dictionary of small size is …

Πgora is an integration system for probabilistic data modelled using different formalisms
such as pc-tables, Bayesian networks, and stochastic automata. User queries are expressed …

Equivalence and dominance relations used earlier in fault diagnosis procedures are defined
as relations between faults, similar to the relations used for fault collapsing. Since the basic …

Given a chip that produced a faulty output response to a test set, a defect diagnosis
procedure produces a set of candidate faults that is expected to identify the defects that are …

Fault diagnosis plays a major role in IC yield enhancement as it can help identify yield
limiting defects in fabricated devices. The information on such defects is used to guide …

In this paper, we present a novel approach to run scan diagnosis in a high volume
manufacturing (HVM) environment. Our methodology enables two usage modes during scan …