As CMOS devices become smaller, process and aging variations become a major issue for
circuit reliability and yield. In this paper, we propose a new two-phase gate sizing approach …

Much of the way we are shaped by evolution is indicative of the kind of environment we had
to survive in. Early records show that we, as humans, had to survive at one point in trees as …

In this work, the impact of lightly doped drain (LDD) implantation doses on hot carrier
degradation (HCD) variability behaviors has been studied for transistors and static random …

We present here a detailed comparison of HCI induced drift of logic devices parameters from
40nm SiON and 28nm HKMG nodes. Repeated HCI stress with sampling ranging from 70 to …

A design methodology for aging aware foldback current limiting is presented. Traditional
constant and foldback limiting techniques are reviewed in the context of hot carrier induced …

Abstract Integrated Circuits (ICs) have made their way into many critical systems that service
transportation, medical, and military industries; areas that are targeted for maximum …

With the global spanning of integrated circuit (IC) and electronic device supply chains, the
ability of an untrusted foundry to alter a design for intellectual property (IP)/IC piracy …

With the global spanning of integrated circuit (IC) and electronic device supply chains, the
ability of an untrusted entity to alter an IC or device while it is in the supply chain increases …