Over the last decade, the industrial world has been involved in a massive revolution guided
by the adoption of digital technologies. In this context, complex systems like cyber-physical …

With increased device integration and a gradual trend toward higher operating frequencies,
the effect of radiation induced transients in combinatorial logic (SETs) can no longer be …

Radiation-induced soft error is a significant reliability issue in nanoscale technology nodes.
As the sequential registers are major contributors to the system soft error rate, accurate …

Mutation testing is a widely accepted method for assessing the effectiveness of software test
suites. It focuses on evaluating how well a test suite can identify deliberately introduced …

Radiation-induced soft error is one of the main issues of system reliability with the
continuous technology scaling. Soft error analysis at early design phase is essential for …

Radiation-induced soft errors, as one of the major reliability challenges in future technology
nodes, have to be carefully taken into consideration in the design space exploration. This …

The main objective of this thesis is to develop techniques that can beused to analyze and
mitigate the effects of radiation-induced soft errors in industrialscale integrated circuits. To …

Mutation Analysis (MA) is a fault-based simulation technique that is used to measure the
quality of testbenches for mutant detections where mutants are simple syntactical changes in …

Fault-based verification technique is a method to qualify a verification environment. The
better verification environment can detect output differences between the fault-free and fault …

Functional verification plays a critical role in ensuring that a digital integrated circuit (IC)
meets the design specification. Dynamic verification uses a large number of test vectors. To …