M Nandipati, O Fatoki, S Desai - Materials, 2024 - mdpi.com
Nanomanufacturing and digital manufacturing (DM) are defining the forefront of the fourth industrial revolution—Industry 4.0—as enabling technologies for the processing of materials …
Lithography simulation is one of the most fundamental steps in process modeling and physical verification. Conventional simulation methods suffer from a tremendous …
To speed up the FPGA placement and routing closure, we propose a novel approach to predict the routing congestion map for large-scale FPGA designs at the placement stage …
With the continuous drive toward integrated circuits scaling, efficient yield analysis is becoming more crucial yet more challenging. In this paper, we propose a novel …
The breakdown performance is a critical metric for power device design. This paper explores the feasibility of efficiently predicting the breakdown performance of silicon on insulator (SOI) …
W Ye, MB Alawieh, Y Watanabe, S Nojima… - Proceedings of the …, 2020 - dl.acm.org
With the continuous shrinking of the semiconductor device dimensions, mask topography effects stand out among the major factors influencing the lithography process. Including …
As the integrated circuits (IC) technology continues to scale, resolution enhancement techniques (RETs) are mandatory to obtain high manufacturing quality and yield. Among …
Lithography hotspot detection is one of the fundamental steps in physical verification. Due to the increasingly complicated design patterns, early and quick feedback for lithography …
As the integrated circuits (ICs) technology continues to scale, resolution enhancement techniques (RETs) are mandatory to obtain high manufacturing quality and yield. Among …