Comprehensive variability analysis in dual-port fefet for reliable multi-level-cell storage

S Chatterjee, S Thomann, K Ni… - … on Electron Devices, 2022 - ieeexplore.ieee.org
HfO 2-based FeFET is a remarkably promising candidate among emerging memory
technologies. Its manifold applications range from nonvolatile memory to neuromorphic …

Influence of annealing temperature on the structural and electrical properties of Si-doped ferroelectric hafnium oxide

M Lederer, P Bagul, D Lehninger… - ACS Applied …, 2021 - ACS Publications
The ferroelectric properties of hafnium oxide films are strongly influenced by the
crystallization process due to the interaction of thermodynamics, kinetics, and mechanical …

Ferroelectricity in CMOS-compatible hafnium oxides: Reviving the ferroelectric field-effect transistor technology

D Das, AI Khan - IEEE Nanotechnology Magazine, 2021 - ieeexplore.ieee.org
A Ferroelectric Field-Effect Transistor (FEFET) is a promising candidate for next-generation
memory devices because it offers numerous advantages, such as its high speed, low energy …

FeFET Reliability Modeling for In-Memory Computing: Challenges, Perspective, and Emerging Trends

S Thomann, H Amrouch - IEEE Transactions on Electron …, 2023 - ieeexplore.ieee.org
Ferroelectric FET (FeFET) is a singularly attractive emerging technology with a rich feature
set. Boasting high versatility, it has already been implemented in a host of applications, like …

Vertical ferroelectric thin-film transistor array with a 10-nm gate length for high-density three-dimensional memory applications

IJ Kim, MK Kim, JS Lee - Applied Physics Letters, 2022 - pubs.aip.org
Hafnia-based ferroelectric thin-film transistors (FeTFTs) are regarded as promising
candidates for future nonvolatile memory devices owing to their low power consumption …

Cross-layer reliability modeling of dual-port fefet: Device-algorithm interaction

S Kumar, S Chatterjee, S Thomann… - … on Circuits and …, 2023 - ieeexplore.ieee.org
The Ferroelectric Field-Effect Transistor (FeFET) is an emerging Non-Volatile Memory (NVM)
technology enabling novel data-centric architectures that go far beyond von Neumann …

Polarization Pruning: Reliability Enhancement of Hafnia‐Based Ferroelectric Devices for Memory and Neuromorphic Computing

RH Koo, W Shin, J Kim, J Yim, J Ko, G Jung… - Advanced …, 2024 - Wiley Online Library
Ferroelectric (FE) materials are key to advancing electronic devices owing to their non‐
volatile properties, rapid state‐switching abilities, and low‐energy consumption. FE‐based …

Variability study of ferroelectric field-effect transistors towards 7nm technology node

G Choe, S Yu - IEEE Journal of the Electron Devices Society, 2021 - ieeexplore.ieee.org
The random variation sources have a significant influence on the performance of
ferroelectric field-effect transistor (FeFET). In this work, comparative analysis on the process …

Cross-layer fefet reliability modeling for robust hyperdimensional computing

S Kumar, S Chatterjee, S Thomann… - 2022 IFIP/IEEE 30th …, 2022 - ieeexplore.ieee.org
Hyperdimensional computing (HDC) is an emerging learning paradigm that has gained a lot
of attention due to its ability to train with fewer data, lightweight implementation, and …

Design Considerations for sub-1V 1T1C FeRAM memory circuits

M Adnaan, SC Chang, H Li, YC Liao… - IEEE Journal on …, 2024 - ieeexplore.ieee.org
We present a comprehensive benchmarking framework for one transistor-one capacitor
(1T1C) low-voltage ferroelectric random access memory (FeRAM) circuits. We focus on the …