Atomic layer deposition of silicon nitride thin films: a review of recent progress, challenges, and outlooks

X Meng, YC Byun, HS Kim, JS Lee, AT Lucero… - Materials, 2016 - mdpi.com
With the continued miniaturization of devices in the semiconductor industry, atomic layer
deposition (ALD) of silicon nitride thin films (SiNx) has attracted great interest due to the …

[HTML][HTML] Atomic layer deposition of silicon-based dielectrics for semiconductor manufacturing: Current status and future outlook

RA Ovanesyan, EA Filatova, SD Elliott… - Journal of Vacuum …, 2019 - pubs.aip.org
The fabrication of next-generation semiconductor devices has created a need for low-
temperature (≤ 400 C) deposition of highly-conformal (> 95%) SiO 2, SiN x, and SiC films …

Gas-phase chemical reactor and method of using same

AJ Niskanen - US Patent 11,286,562, 2022 - Google Patents
A gas-phase chemical reactor, a system including the reac tor, and methods of using the
reactor and system are dis closed. An exemplary reactor includes a reaction chamber and is …

Silicon nitride and silicon nitride-rich thin film technologies: trends in deposition techniques and related applications

AE Kaloyeros, FA Jové, J Goff… - ECS Journal of Solid State …, 2017 - iopscience.iop.org
This article provides an overview of the state-of-the-art chemistry and processing
technologies for silicon nitride and silicon nitride-rich films, ie, silicon nitride with C inclusion …

[HTML][HTML] Tailoring the synaptic properties of a-IGZO memristors for artificial deep neural networks

ME Pereira, J Deuermeier, P Freitas, P Barquinha… - APL Materials, 2022 - pubs.aip.org
Neuromorphic computation based on resistive switching devices represents a relevant
hardware alternative for artificial deep neural networks. For the highest accuracies on …

Silicon nitride and hydrogenated silicon nitride thin films: A review of fabrication methods and applications

N Hegedüs, K Balázsi, C Balázsi - Materials, 2021 - mdpi.com
Silicon nitride (SiNx) and hydrogenated silicon nitride (SiNx: H) thin films enjoy widespread
scientific interest across multiple application fields. Exceptional combination of optical …

Method and apparatus for filling a recess formed within a substrate surface

V Pore, Z Liu - US Patent 11,227,789, 2022 - Google Patents
There is provided a method of filling one or more recesses by providing the substrate in a
reaction chamber and intro ducing a first reactant to the substrate with a first dose …

High‐performance zinc tin oxide TFTs with active layers deposited by atomic layer deposition

CR Allemang, TH Cho, O Trejo, S Ravan… - Advanced Electronic …, 2020 - Wiley Online Library
New deposition techniques for amorphous oxide semiconductors compatible with silicon
back end of line manufacturing are needed for 3D monolithic integration of thin‐film …

Remote Plasma Atomic Layer Deposition of SiNx Using Cyclosilazane and H2/N2 Plasma

H Cho, N Lee, H Choi, H Park, C Jung, S Song, H Yuk… - Applied Sciences, 2019 - mdpi.com
Silicon nitride (SiNx) thin films using 1, 3-di-isopropylamino-2, 4-dimethylcyclosilazane
(CSN-2) and N2 plasma were investigated. The growth rate of SiNx thin films was saturated …

Measurements of microstructural, chemical, optical, and electrical properties of silicon-oxygen-nitrogen films prepared by plasma-enhanced atomic layer deposition

HP Ma, HL Lu, JH Yang, XX Li, T Wang, W Huang… - Nanomaterials, 2018 - mdpi.com
In this study, silicon nitride (SiNx) thin films with different oxygen concentration (ie, SiON film)
were precisely deposited by plasma enhanced atomic layer deposition on Si (100) …