Strained Si, SiGe, and Ge channels for high-mobility metal-oxide-semiconductor field-effect transistors

ML Lee, EA Fitzgerald, MT Bulsara, MT Currie… - Journal of applied …, 2005 - pubs.aip.org
This article reviews the history and current progress in high-mobility strained Si, SiGe, and
Ge channel metal-oxide-semiconductor field-effect transistors (MOSFETs). We start by …

Critical thickness enhancement of epitaxial SiGe films grown on small structures

Y Liang, WD Nix, PB Griffin, JD Plummer - Journal of Applied Physics, 2005 - pubs.aip.org
This paper explores stress management in SiGe with two kinds of structures, namely,
epitaxial SiGe films on small pillars and fins. In addition to the compliant substrate effect in …

Fully-depleted strained-Si on insulator NMOSFETs without relaxed SiGe buffers

H Yin, KD Hobart, RL Peterson, FJ Kub… - IEEE International …, 2003 - ieeexplore.ieee.org
Fully-depleted strained Si n-channel MOSFETs were demonstrated on a compliant
borophosphorosilicate insulator (BPSG) without an underlying SiGe buffer layer. Stress …

Misfit dislocations in nanocomposites with quantum dots, nanowires and their ensembles

IA Ovid'Ko, AG Sheinerman - Advances in Physics, 2006 - Taylor & Francis
We review theoretical concepts and experimental results on the physics of misfit dislocations
in nanocomposite solids with quantum dots (QDs) and nanowires (quantum wires). Special …

Elastic strain relaxation in free-standing SiGe/Si structures

PM Mooney, GM Cohen, JO Chu, CE Murray - Applied Physics Letters, 2004 - pubs.aip.org
We have investigated elastic strain relaxation, ie, strain relaxation without the introduction of
dislocations or other defects, in free-standing SiGe/Si structures. We fabricated free-standing …

Compliant tin-based buffers for the growth of defect-free strained heterostructures on silicon

J Tolle, R Roucka, AVG Chizmeshya… - Applied physics …, 2006 - pubs.aip.org
We describe the compliant behavior of Ge 1− y Sn y buffer layers grown strain-free on Si
(100). Deposition of lattice-mismatched epilayers on these buffers introduces significant …

Buckling suppression of SiGe islands on compliant substrates

H Yin, R Huang, KD Hobart, J Liang, Z Suo… - Journal of Applied …, 2003 - pubs.aip.org
A cap layer was used to suppress buckling during the relaxation of compressively strained
30 nm Si 0.7 Ge 0.3 islands on borophosphorosilicate glass. The lateral expansion and …

Layout variation effects in advanced MOSFETs: STI-induced embedded SiGe strain relaxation and dual-stress-liner boundary proximity effect

YS Choi, G Lian, C Vartuli, O Olubuyide… - IEEE transactions on …, 2010 - ieeexplore.ieee.org
This paper reports two areas of focus for layout variation effects in advanced strained-Si
technology: 1) shallow-trench isolation (STI)-induced embedded SiGe (eSiGe) strain …

Wafer‐Scale Strain Engineering of Ultrathin Semiconductor Crystalline Layers

MS Leite, EC Warmann, GM Kimball… - Advanced …, 2011 - Wiley Online Library
Semiconductor epitaxial alloys are widely used in solid state such as lasers, light-emitting
diodes and photovoltaics.[1–3] Currently, the versatility of the semiconductor epitaxial …

Semiconductor process for forming stress absorbent shallow trench isolation structures

MK Orlowski, MC Foisy, OO Adetutu - US Patent 7,442,621, 2008 - Google Patents
A semiconductor fabrication process includes patterning a hard mask over a semiconductor
substrate to expose an isolation region and forming a trench in the isolation region. A …