The metal-insulator switching characteristics of VO 2 play a crucial role in the performances of VO 2-based devices. In this paper we study high-quality (010)-oriented epitaxial films …
Large area (up to 4 squared inches) epitaxial VO 2 films, with a uniform thickness and exhibiting an abrupt metal-insulator transition with a resistivity ratio as high as 2.85× 10 4 …
A Bartasyte, V Plausinaitiene, A Abrutis… - Journal of Physics …, 2013 - iopscience.iop.org
Phase composition of epitaxial/textured LiNbO 3 films on sapphire substrates, grown by pulsed laser deposition, atmospheric pressure metal organic chemical vapor deposition and …
Modification of materials using ion beams has become a widespread route to improve or design materials for advanced applications, from ion doping for microelectronic devices to …
A combination of experimental and computational evaluations of disorder level and lattice swelling in ion-irradiated materials is presented. Information obtained from x-ray diffraction …
M Souilah, A Boulle, A Debelle - Journal of Applied …, 2016 - journals.iucr.org
RaDMaX (radiation damage in materials analysed with X-ray diffraction) is a user-friendly graphical program that allows the determination of strain and damage depth profiles in ion …
Abstract α-MoO 3 lamellar crystals are implanted with 170 keV oxygen ions at room temperature and with fluences between 1× 10 12 cm− 2 and 1× 10 17 cm− 2, in order to …
Atomic disorder in irradiated materials is investigated by means of x-ray diffraction, using cubic SiC single crystals as a model material. It is shown that, besides the determination of …
O Durand, A Letoublon, DJ Rogers, FH Teherani - Thin Solid Films, 2011 - Elsevier
X-ray scattering methods were applied to the study of thin mosaic ZnO layers deposited on c- Al 2 O 3 substrates using Pulsed Laser Deposition. High Resolution (HR) studies revealed …