Traditionally, work on analog testing has focused on diagnosing faults in board designs.
Recently, with increasing levels of integration, not just diagnosing faults, but distinguishing …

We have developed an analog-circuit fault diagnostic system based on backpropagation
neural networks using wavelet decomposition, principal component analysis, and data …

We have developed a modular analog circuit fault-diagnostic system based on neural
networks using wavelet decomposition, principal component analysis, and data …

Analog circuit design is often the bottleneck when designing mixed analog-digital systems. A
Top-Down, Constraint-Driven Design Methodology for Analog Integrated Circuits presents a …

Increasing levels of integration and high speeds of operation have made the problem of
testing complex systems-on-packages (SOPs) very difficult. Testing packages with …

Testability analysis of analog circuits in the presence of soft, large-deviation, and hard faults
greatly facilitates production of testable systems. The authors analyze these faults by …

We discuss a fault diagnosis scheme for analog integrated circuits. Our approach is based
on an assemblage of learning machines that are trained beforehand to guide us through …

Coefficient-based test (CBT) is introduced for detecting parametric faults in analog circuits.
The method uses pseudo Monte Carlo simulation and system-identification tools to …

This paper investigates the detectability of parameter faults in linear, time-invariant, analog
circuits and sheds new light on a number of very important test attributes. We show that there …

Testability analysis in analog circuits is an important task and a desirable approach for
producing testable complex systems. In past years, most of the testability evaluation …