A cryogenic broadband sub-1-dB NF CMOS low noise amplifier for quantum applications

Y Peng, A Ruffino, E Charbon - IEEE Journal of Solid-State …, 2021 - ieeexplore.ieee.org
A cryogenic broadband low noise amplifier (LNA) for quantum applications based on a
standard 40-nm CMOS technology is reported. The LNA specifications are derived from the …

Characterization and analysis of on-chip microwave passive components at cryogenic temperatures

B Patra, M Mehrpoo, A Ruffino… - IEEE Journal of the …, 2020 - ieeexplore.ieee.org
This paper presents the characterization and modeling of microwave passive components in
TSMC 40-nm bulk CMOS, including metal-oxide-metal (MoM) capacitors, transformers, and …

Design and analysis of a 4.2 mW 4 K 6–8 GHz CMOS LNA for superconducting qubit readout

A Caglar, S Van Winckel, S Brebels… - IEEE Journal of Solid …, 2022 - ieeexplore.ieee.org
This article proposes a cryogenic inverter-based low noise amplifier (LNA) for qubit readout.
Its input impedance matching is realized by a high-ON-chip gate inductor and capacitive …

Investigation on temperature behavior for a GaAs E-pHEMT MMIC LNA

Q Lin, L Jia, H Wu, X Wang - Micromachines, 2022 - mdpi.com
In order to investigate the temperature behavior for monolithic microwave integrated circuits
(MMICs) under alpine conditions, the performance parameters of a 0.4–3.8 GHz gallium …

Impact of Deep Cryogenic Temperatures on High-k Stacked Dual Gate Junctionless MOSFET Performance: Analog and RF analysis

R Ghosh, RP Nelapati - Silicon, 2024 - Springer
This article presents the reliability analysis of a High-k stacked Dual Gate Junction-less
MOSFET at Deep Cryogenic Temperatures (as low as 50 Kelvin) in terms of dc, analog and …

An ultra-low noise figure and multi-band re-configurable low noise amplifier

N Bajpai, P Maity, M Shah, A Das… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
In this article, we design and fabricate an ultra-low noise figure, multi-band low noise
amplifier (LNA) monolithic microwave integrated circuit (MMIC) using GaAs pHEMT process …

Performance degradation investigation for a GaAs PHEMT high gain MMIC PA taking into account the temperature

L Jia, Q Lin, H Wu, X Wang - electronics, 2022 - mdpi.com
In order to comprehensively grasp the performance changes for the monolithic microwave
integrated circuit (MMIC), this paper proposes that the complete temperature reliability tests …

Holistic device modeling: Toward a unified MOSFET model including variability, aging, and extreme operating conditions

MB Yelten - IEEE Transactions on Circuits and Systems II …, 2022 - ieeexplore.ieee.org
This tutorial presents the holistic modeling concept in the context of metal-oxide-
semiconductor field-effect-transistors (MOSFETs). First, the standard MOSFET modeling …

A 4.2-9.2 GHz cryogenic transformer feedback low noise amplifier with 4.5 K noise temperature and noise-power matching in 22nm CMOS FDSOI

B Lin, H Mani, P Marsh, R Al Hadi… - 2022 IEEE Radio …, 2022 - ieeexplore.ieee.org
This paper presents a compact broadband cryogenic low noise amplifier (LNA) with
simultaneous noise and power matching with transformer-based feedback. The LNA is …

An automated setup for the characterization of time-based degradation effects including the process variability in 40-nm CMOS transistors

X Xhafa, AD Güngördü, D Erol, Y Yavuz… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
This article reports a test chip design in commercial 40-nm process technology to
characterize the level of time-based degradation in metal-oxide-semiconductor field-effect …