Crystallinity of inorganic films grown by atomic layer deposition: Overview and general trends

V Miikkulainen, M Leskelä, M Ritala… - Journal of Applied …, 2013 - pubs.aip.org
Atomic layer deposition (ALD) is gaining attention as a thin film deposition method, uniquely
suitable for depositing uniform and conformal films on complex three-dimensional …

Atomic layer deposition of groups 4 and 5 transition metal oxide thin films: focus on heteroleptic precursors

T Blanquart, J Niinistö, M Ritala… - Chemical Vapor …, 2014 - Wiley Online Library
The atomic layer deposition (ALD) process, an alternative to CVD, is universally appreciated
for its unique advantages such as excellent repeatability, conformity, and thickness control at …

Influence of temperature and plasma parameters on the properties of PEALD HfO2

M Lapteva, V Beladiya, S Riese, P Hanke… - Optical Materials …, 2021 - opg.optica.org
HfO_2 has promising applications in semiconductors and optics due to its high dielectric
constant and high refractive index. In this work, HfO_2 thin films were deposited by plasma …

Overview of chemical vapour deposition

AC Jones, ML Hitchman - Chemical vapour deposition …, 2009 - books.google.com
In the broadest sense chemical vapour deposition (CVD) involves the formation of a thin
solid film on a substrate material by a chemical reaction of vapour-phase precursors. It can …

Preparation of wafer-scale highly conformalamorphous hafnium dioxide thin films by atomic layer deposition using a thermally stable boratabenzene ligand-containing …

MZ Ansari, P Janicek, YJ Park, S NamGung… - Applied Surface …, 2023 - Elsevier
In the present study, HfO 2 thin films were fabricated via atomic layer deposition (ALD) using
a novel heteroleptic metal organic precursor [tris (dimethylamino) …

The Atomic Layer Deposition of HfO2 and ZrO2 using Advanced Metallocene Precursors and H2O as the Oxygen Source

CL Dezelah IV, J Niinistö, K Kukli… - Chemical Vapor …, 2008 - Wiley Online Library
The atomic layer deposition (ALD) of HfO2 and ZrO2 thin films is investigated using (MeCp)
2HfMe2,(MeCp) 2Hf (OMe)(Me),(MeCp) 2ZrMe2, and (MeCp) 2Zr (OMe)(Me) as the …

Deposition of ZrO 2 and HfO 2 thin films by liquid injection MOCVD and ALD using ansa-metallocene zirconium and hafnium precursors

K Black, HC Aspinall, AC Jones, K Przybylak… - Journal of Materials …, 2008 - pubs.rsc.org
Thin films of ZrO2 and HfO2 have been deposited by liquid injection metalorganic chemical
vapour deposition (MOCVD) and atomic layer deposition (ALD) using a range of ansa …

Co-60 gamma irradiation influences on physical, chemical and electrical characteristics of HfO2/Si thin films

S Kaya, I Yıldız, R Lok, E Yılmaz - Radiation Physics and Chemistry, 2018 - Elsevier
Co-60 gamma irradiation effects on physical, chemical and electrical characteristics of HfO
2/Si thin films have been investigated in details. The variations on the crystallographic …

Oxygen vacancy induced structure change and interface reaction in HfO2 films on native SiO2/Si substrate

K Yan, W Yao, Y Zhao, L Yang, J Cao, Y Zhu - Applied Surface Science, 2016 - Elsevier
The HfO 2 films were deposited on SiO 2 (native)/n-Si (100) substrates by electron beam
evaporation (EBE) technology. The structural evolution of the films during thermal annealing …

ALD precursors and reaction mechanisms

RG Gordon - Atomic Layer Deposition for Semiconductors, 2013 - Springer
Successful use of ALD requires chemical precursors with sufficient volatility, thermal stability,
and self-limited reactivity with surfaces. Effective ALD precursors are now known for most …