A review of mechanical properties of lead-free solders for electronic packaging

H Ma, JC Suhling - Journal of materials science, 2009 - Springer
The characterization of lead-free solders, especially after isothermal aging, is very important
in order to accurately predict the reliability of solder joints. However, due to lack of …

Joining and interconnect formation of nanowires and carbon nanotubes for nanoelectronics and nanosystems

Q Cui, F Gao, S Mukherjee, Z Gu - Small, 2009 - Wiley Online Library
Interconnect formation is critical for the assembly and integration of nanocomponents to
enable nanoelectronics‐and nanosystems‐related applications. Recent progress on joining …

Effects of solder thickness on interface behavior and nanoindentation characteristics in Cu/Sn/Cu microbumps

Z Zhang, J Chen, J Wang, Y Han, Z Yu, Q Wang… - Welding in the …, 2022 - Springer
The thickness of the solder, for Cu/Sn/Cu microbumps with dimensions of tens of microns or
even a few microns (such as 40 µm, 15 µm, 10 µm, and 6 µm), can have a significant effect …

Reliability of the aging lead free solder joint

H Ma, JC Suhling, P Lall… - 56th Electronic …, 2006 - ieeexplore.ieee.org
Solder materials demonstrate evolving microstructure and mechanical behavior that
changes significantly with environmental exposures such as isothermal aging and thermal …

The influence of elevated temperature aging on reliability of lead free solder joints

H Ma, JC Suhling, Y Zhang, P Lall… - 2007 Proceedings …, 2007 - ieeexplore.ieee.org
The microstructure, mechanical response, and failure behavior of lead free solder joints in
electronic assemblies are constantly evolving when exposed to isothermal aging and/or …

Structural, electronic, and elastic properties of orthorhombic, hexagonal, and cubic Cu3Sn intermetallic compounds in Sn–Cu lead-free solder

D Qu, C Li, L Bao, Z Kong, Y Duan - Journal of Physics and Chemistry of …, 2020 - Elsevier
In order to obtain a better understanding of the phase stabilities and mechanical behaviors
of Cu 3 Sn compounds, we performed first-principles calculations to predict the structural …

The effects of aging temperature on SAC solder joint material behavior and reliability

Y Zhang, Z Cai, JC Suhling, P Lall… - 2008 58th Electronic …, 2008 - ieeexplore.ieee.org
The effects of aging on mechanical behavior of lead free solders have been examined by
performing creep tests on four different SAC alloys (SAC105, SAC205, SAC305, SAC405) …

The nanoindentation characteristics of Cu6Sn5, Cu3Sn, and Ni3Sn4 intermetallic compounds in the solder bump

GY Jang, JW Lee, JG Duh - Journal of Electronic materials, 2004 - Springer
In general, formation and growth of intermetallic compounds (IMCs) play a major role in the
reliability of the solder joint in electronics packaging and assembly. The formation of Cu-Sn …

Characterization of aging effects in lead free solder joints using nanoindentation

M Hasnine, M Mustafa, JC Suhling… - 2013 IEEE 63rd …, 2013 - ieeexplore.ieee.org
The mechanical properties of a lead free solder are strongly influenced by its microstructure,
which is controlled by its thermal history including solidification rate and thermal aging after …

Theoretical explorations of structure, mechanical properties, fracture toughness, electronic properties, and thermal conductivity of Ag-doped η′-Cu6Sn5

A Yang, Y Duan, C Li, J Yi, M Peng - Intermetallics, 2022 - Elsevier
In this work, the phase stability, elasticity, fracture toughness, electronic characteristics and
thermal conductivity of Ag-doped η′-Cu 6 Sn 5 were explored based on the first-principles …