Engineering Ferroelectric Hf0.5Zr0.5O2 Thin Films by Epitaxial Stress

S Estandia, N Dix, J Gazquez, I Fina, J Lyu… - ACS Applied …, 2019 - ACS Publications
The critical impact of epitaxial stress on the stabilization of the ferroelectric orthorhombic
phase of hafnia is proved. Epitaxial bilayers of Hf0. 5Zr0. 5O2 (HZO) and La0. 67Sr0 …

Stabilization of phase-pure rhombohedral in pulsed laser deposited thin films

L Bégon-Lours, M Mulder, P Nukala, S De Graaf… - Physical Review …, 2020 - APS
Controlling the crystalline structure of hafnium zirconate and its epitaxial relationship to a
semiconducting electrode has high technological interest, as ferroelectric materials are key …

Vector piezoelectric response and ferroelectric domain formation in Hf 0.5 Zr 0.5 O 2 films

H Tan, T Song, N Dix, F Sánchez, I Fina - Journal of Materials …, 2023 - pubs.rsc.org
The piezoelectric response in polycrystalline films of doped ferroelectric HfO2 has been
explored so far; however, the lack of texture in most of the studied films prevents its full …

No‐Heating Deposition of 1‐μm‐Thick Y‐Doped HfO2 Ferroelectric Films with Good Ferroelectric and Piezoelectric Properties by Radio Frequency Magnetron …

R Shimura, T Mimura, A Tateyama… - physica status solidi …, 2022 - Wiley Online Library
Y‐doped HfO2 ferroelectric films of≈ 1 μm thick are deposited without heating by a radio
frequency magnetron sputtering method.{100}‐oriented epitaxial films with orthorhombic …